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Applied Optics
|
April 1, 1985
Scintillating optic fiber array for high-resolution x-ray imaging over 5 keV
E Bigler, F Polack
The Review of Scientific Instruments
|
March 6, 2019
Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometry
A Akarid, F Polack
Scanning Microscopy. Supplement
|
January 1, 1987
The photoelectron x-ray microscope, a possible tool for analytical soft x-ray microscopy
F Polack, S Lowenthal
Optics Letters
|
September 29, 2009
Twin-image elimination in in-line holography of finite-support complex objects
G Koren, D Joyeux, F Polack
Optics Letters
|
October 14, 2009
Soft-x-ray interferometer for measuring the refractive index of materials
J Svatos, D Joyeux, D Phalippou, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
Optimization strategies for XUV monochromators
F Polack, E Delcamp, B Lagarde, et al.
Investigative Ophthalmology
|
March 1, 1976
Immune host response to corneal grafts sensitized to herpes simplex virus
F Polack, C Siverio, F Bigar, et al.
The Review of Scientific Instruments
|
March 6, 2019
Surface shape determination with a stitching Michelson interferometer and accuracy evaluation
F Polack, M Thomasset, S Brochet, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
High-flux and high-resolution spectroscopic facility in the VUV region at Super-ACO
K Ito, B Lagarde, F Polack, et al.
The Review of Scientific Instruments
|
March 6, 2019
Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL
M Thomasset, J Dvorak, S Brochet, et al.
Page
of 3
Search research articles
Search
Showing results (1-10 of 21) with videos related to
Sort By:
Page
of 3
Applied Optics
|
April 1, 1985
Scintillating optic fiber array for high-resolution x-ray imaging over 5 keV
E Bigler, F Polack
The Review of Scientific Instruments
|
March 6, 2019
Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometry
A Akarid, F Polack
Scanning Microscopy. Supplement
|
January 1, 1987
The photoelectron x-ray microscope, a possible tool for analytical soft x-ray microscopy
F Polack, S Lowenthal
Optics Letters
|
September 29, 2009
Twin-image elimination in in-line holography of finite-support complex objects
G Koren, D Joyeux, F Polack
Optics Letters
|
October 14, 2009
Soft-x-ray interferometer for measuring the refractive index of materials
J Svatos, D Joyeux, D Phalippou, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
Optimization strategies for XUV monochromators
F Polack, E Delcamp, B Lagarde, et al.
Investigative Ophthalmology
|
March 1, 1976
Immune host response to corneal grafts sensitized to herpes simplex virus
F Polack, C Siverio, F Bigar, et al.
The Review of Scientific Instruments
|
March 6, 2019
Surface shape determination with a stitching Michelson interferometer and accuracy evaluation
F Polack, M Thomasset, S Brochet, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
High-flux and high-resolution spectroscopic facility in the VUV region at Super-ACO
K Ito, B Lagarde, F Polack, et al.
The Review of Scientific Instruments
|
March 6, 2019
Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL
M Thomasset, J Dvorak, S Brochet, et al.
Page
of 3