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F Polack

Showing results (1-10 of 21) with videos related to

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Applied Optics|April 1, 1985
Scintillating optic fiber array for high-resolution x-ray imaging over 5 keVE Bigler, F Polack
The Review of Scientific Instruments|March 6, 2019
Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometryA Akarid, F Polack
Scanning Microscopy. Supplement|January 1, 1987
The photoelectron x-ray microscope, a possible tool for analytical soft x-ray microscopyF Polack, S Lowenthal
Optics Letters|September 29, 2009
Twin-image elimination in in-line holography of finite-support complex objectsG Koren, D Joyeux, F Polack
Optics Letters|October 14, 2009
Soft-x-ray interferometer for measuring the refractive index of materialsJ Svatos, D Joyeux, D Phalippou, et al.
Journal of Synchrotron Radiation|July 21, 2004
Optimization strategies for XUV monochromatorsF Polack, E Delcamp, B Lagarde, et al.
Investigative Ophthalmology|March 1, 1976
Immune host response to corneal grafts sensitized to herpes simplex virusF Polack, C Siverio, F Bigar, et al.
The Review of Scientific Instruments|March 6, 2019
Surface shape determination with a stitching Michelson interferometer and accuracy evaluationF Polack, M Thomasset, S Brochet, et al.
Journal of Synchrotron Radiation|July 21, 2004
High-flux and high-resolution spectroscopic facility in the VUV region at Super-ACOK Ito, B Lagarde, F Polack, et al.
The Review of Scientific Instruments|March 6, 2019
Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEILM Thomasset, J Dvorak, S Brochet, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
Applied Optics|April 1, 1985
Scintillating optic fiber array for high-resolution x-ray imaging over 5 keVE Bigler, F Polack
The Review of Scientific Instruments|March 6, 2019
Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometryA Akarid, F Polack
Scanning Microscopy. Supplement|January 1, 1987
The photoelectron x-ray microscope, a possible tool for analytical soft x-ray microscopyF Polack, S Lowenthal
Optics Letters|September 29, 2009
Twin-image elimination in in-line holography of finite-support complex objectsG Koren, D Joyeux, F Polack
Optics Letters|October 14, 2009
Soft-x-ray interferometer for measuring the refractive index of materialsJ Svatos, D Joyeux, D Phalippou, et al.
Journal of Synchrotron Radiation|July 21, 2004
Optimization strategies for XUV monochromatorsF Polack, E Delcamp, B Lagarde, et al.
Investigative Ophthalmology|March 1, 1976
Immune host response to corneal grafts sensitized to herpes simplex virusF Polack, C Siverio, F Bigar, et al.
The Review of Scientific Instruments|March 6, 2019
Surface shape determination with a stitching Michelson interferometer and accuracy evaluationF Polack, M Thomasset, S Brochet, et al.
Journal of Synchrotron Radiation|July 21, 2004
High-flux and high-resolution spectroscopic facility in the VUV region at Super-ACOK Ito, B Lagarde, F Polack, et al.
The Review of Scientific Instruments|March 6, 2019
Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEILM Thomasset, J Dvorak, S Brochet, et al.
Pageof 3