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F Vurpillot

Showing results (1-10 of 25) with videos related to

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Ultramicroscopy|February 28, 2015
Modeling Atom Probe Tomography: A reviewF Vurpillot, C Oberdorfer
Ultramicroscopy|February 22, 2011
Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomographyW Lefebvre, T Philippe, F Vurpillot
Ultramicroscopy|January 5, 2002
A new approach to the interpretation of atom probe field-ion microscopy imagesF Vurpillot, A Bostel, D Blavette
Ultramicroscopy|January 22, 2003
A new step towards the lattice reconstruction in 3DAPF Vurpillot, L Renaud, D Blavette
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 14, 2019
Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation ApproachC Bacchi, G Da Costa, F Vurpillot
Ultramicroscopy|January 5, 2002
A model accounting for spatial overlaps in 3D atom-probe microscopyD Blavette, F Vurpillot, P Pareige, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Modeling image distortions in 3DAPF Vurpillot, A Cerezo, D Blavette, et al.
Journal of Microscopy|September 14, 2001
Structural analyses in three-dimensional atom probe: a Fourier transform approachF Vurpillot, G Da Costa, A Menand, et al.
Ultramicroscopy|February 13, 2013
A model to predict image formation in Atom probe TomographyF Vurpillot, A Gaillard, G Da Costa, et al.
Ultramicroscopy|April 3, 2007
Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporationM Gilbert, F Vurpillot, A Vella, et al.
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Ultramicroscopy|February 28, 2015
Modeling Atom Probe Tomography: A reviewF Vurpillot, C Oberdorfer
Ultramicroscopy|February 22, 2011
Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomographyW Lefebvre, T Philippe, F Vurpillot
Ultramicroscopy|January 5, 2002
A new approach to the interpretation of atom probe field-ion microscopy imagesF Vurpillot, A Bostel, D Blavette
Ultramicroscopy|January 22, 2003
A new step towards the lattice reconstruction in 3DAPF Vurpillot, L Renaud, D Blavette
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 14, 2019
Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation ApproachC Bacchi, G Da Costa, F Vurpillot
Ultramicroscopy|January 5, 2002
A model accounting for spatial overlaps in 3D atom-probe microscopyD Blavette, F Vurpillot, P Pareige, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Modeling image distortions in 3DAPF Vurpillot, A Cerezo, D Blavette, et al.
Journal of Microscopy|September 14, 2001
Structural analyses in three-dimensional atom probe: a Fourier transform approachF Vurpillot, G Da Costa, A Menand, et al.
Ultramicroscopy|February 13, 2013
A model to predict image formation in Atom probe TomographyF Vurpillot, A Gaillard, G Da Costa, et al.
Ultramicroscopy|April 3, 2007
Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporationM Gilbert, F Vurpillot, A Vella, et al.
Pageof 3