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Micron (Oxford, England : 1993)|August 5, 2003
About forbidden and weak reflectionsP Geuens, D Van DyckJournal of Microscopy|October 21, 1998
Desktop X-ray microscopy and microtomographyA Sasov, D Van DyckUltramicroscopy|May 13, 2015
MULTEM: A new multislice program to perform accurate and fast electron diffraction and imaging simulations using Graphics Processing Units with CUDAI Lobato, D Van DyckMicroscopy Research and Technique|May 18, 2000
Exit wave reconstructions using through focus series of HREM imagesH W Zandbergen, D Van DyckUltramicroscopy|July 6, 2005
Nonlinear imaging using annular dark field TEMS Bals, R Kilaas, C KisielowskiUltramicroscopy|December 31, 2011
A surprise in the first Born approximation for electron scatteringM M J Treacy, D Van DyckUltramicroscopy|September 21, 2011
High precision measurements of atom column positions using model-based exit wave reconstructionA De Backer, S Van Aert, D Van DyckUltramicroscopy|June 26, 2012
Using a monochromator to improve the resolution in TEM to below 0.5 Å. Part II: application to focal series reconstructionP C Tiemeijer, M Bischoff, B Freitag, et al.Ultramicroscopy|July 27, 2010
Linear versus non-linear structural information limit in high-resolution transmission electron microscopyS Van Aert, J H Chen, D Van DyckPageof 15