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Fa-Quan Zhou

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The Review of Scientific Instruments|April 7, 2007
Improved parallel scan method for nanofriction force measurement with atomic force microscopyYu-Liang Wang, Xue-Zeng Zhao, Fa-Quan Zhou
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 25, 2010
An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopyFa-Quan Zhou, Xue-Zeng Zhao, Fei Wang, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
The Review of Scientific Instruments|April 7, 2007
Improved parallel scan method for nanofriction force measurement with atomic force microscopyYu-Liang Wang, Xue-Zeng Zhao, Fa-Quan Zhou
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 25, 2010
An operating method with lateral scan for reducing the error in topography caused by the tip-sample angle in atomic force microscopyFa-Quan Zhou, Xue-Zeng Zhao, Fei Wang, et al.
Pageof 1