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Optics Express|October 15, 2022
Characterization of encapsulated graphene layers using extreme ultraviolet coherence tomographyFelix Wiesner, Slawomir Skruszewicz, Christian Rödel, et al.
The Review of Scientific Instruments|November 30, 2019
Laboratory setup for extreme ultraviolet coherence tomography driven by a high-harmonic sourceJan Nathanael, Martin Wünsche, Silvio Fuchs, et al.
The Review of Scientific Instruments|March 6, 2019
A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysisMartin Wünsche, Silvio Fuchs, Thomas Weber, et al.
Optics Express|October 19, 2022
Absolute EUV reflectivity measurements using a broadband high-harmonic source and an in situ single exposure reference schemeJohann J Abel, Felix Wiesner, Jan Nathanael, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 9, 2023
Laboratory-Based Correlative Soft X-ray and Fluorescence Microscopy in an Integrated SetupJulius Reinhard, Sophia Kaleta, Johann Jakob Abel, et al.
Optics Express|December 23, 2022
Broadband soft X-ray source from a clustered gas target dedicated to high-resolution XCT and X-ray absorption spectroscopyKarol A Janulewicz, Łukasz Węgrzyński, Tomasz Fok, et al.
Light, Science & Applications|January 21, 2026
Soft X-ray imaging with coherence tomography in the water window spectral range using high-harmonic generationJulius Reinhard, Felix Wiesner, Martin Hennecke, et al.
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