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Frank Barkusky

Showing results (1-10 of 3) with videos related to

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Optics Express|April 15, 2010
Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma sourceFrank Barkusky, Armin Bayer, Stefan Döring, et al.
The Review of Scientific Instruments|October 2, 2009
Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral rangeFrank Barkusky, Christian Peth, Armin Bayer, et al.
The Review of Scientific Instruments|November 6, 2007
XUV laser-plasma source based on solid Ar filamentChristian Peth, Anton Kalinin, Frank Barkusky, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Optics Express|April 15, 2010
Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma sourceFrank Barkusky, Armin Bayer, Stefan Döring, et al.
The Review of Scientific Instruments|October 2, 2009
Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral rangeFrank Barkusky, Christian Peth, Armin Bayer, et al.
The Review of Scientific Instruments|November 6, 2007
XUV laser-plasma source based on solid Ar filamentChristian Peth, Anton Kalinin, Frank Barkusky, et al.
Pageof 1