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Scientific Reports
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February 16, 2019
Towards calibration-invariant spectroscopy using deep learning
M Chatzidakis, G A Botton
Ultramicroscopy
|
September 10, 2023
Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy
A Pofelski, Y Zhu, G A Botton
Ultramicroscopy
|
July 28, 2006
Electron inelastic scattering and anisotropy: The two-dimensional point of view
G Radtke, G A Botton, J Verbeeck
Ultramicroscopy
|
November 30, 2021
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy
A Pofelski, I Bicket, G A Botton
Ultramicroscopy
|
July 29, 2006
Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope
S Lazar, G A Botton, H W Zandbergen
Micron (Oxford, England : 1993)
|
September 24, 2014
Preface. Electron-beam irradiation effects, modifications and control
G A Botton, H A Calderon, C Kisielowski
Micron (Oxford, England : 1993)
|
November 27, 2007
Investigation of the oxide shell forming on epsilon-Co nanocrystals
N Braidy, S Behal, A Adronov, et al.
Ultramicroscopy
|
December 30, 2019
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopy
A Pofelski, S Ghanad-Tavakoli, D A Thompson, et al.
Nano Letters
|
March 31, 2011
Multipolar plasmonic resonances in silver nanowire antennas imaged with a subnanometer electron probe
D Rossouw, M Couillard, J Vickery, et al.
Micron (Oxford, England : 1993)
|
August 12, 2011
Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images
K J Dudeck, M Couillard, S Lazar, et al.
Page
of 3
Search research articles
Search
Showing results (1-10 of 24) with videos related to
Sort By:
Page
of 3
Scientific Reports
|
February 16, 2019
Towards calibration-invariant spectroscopy using deep learning
M Chatzidakis, G A Botton
Ultramicroscopy
|
September 10, 2023
Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron Microscopy
A Pofelski, Y Zhu, G A Botton
Ultramicroscopy
|
July 28, 2006
Electron inelastic scattering and anisotropy: The two-dimensional point of view
G Radtke, G A Botton, J Verbeeck
Ultramicroscopy
|
November 30, 2021
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy
A Pofelski, I Bicket, G A Botton
Ultramicroscopy
|
July 29, 2006
Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscope
S Lazar, G A Botton, H W Zandbergen
Micron (Oxford, England : 1993)
|
September 24, 2014
Preface. Electron-beam irradiation effects, modifications and control
G A Botton, H A Calderon, C Kisielowski
Micron (Oxford, England : 1993)
|
November 27, 2007
Investigation of the oxide shell forming on epsilon-Co nanocrystals
N Braidy, S Behal, A Adronov, et al.
Ultramicroscopy
|
December 30, 2019
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopy
A Pofelski, S Ghanad-Tavakoli, D A Thompson, et al.
Nano Letters
|
March 31, 2011
Multipolar plasmonic resonances in silver nanowire antennas imaged with a subnanometer electron probe
D Rossouw, M Couillard, J Vickery, et al.
Micron (Oxford, England : 1993)
|
August 12, 2011
Quantitative statistical analysis, optimization and noise reduction of atomic resolved electron energy loss spectrum images
K J Dudeck, M Couillard, S Lazar, et al.
Page
of 3