Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Geoffrey H Campbell

Showing results (1-10 of 9) with videos related to

Pageof 1
Sort By:
Advanced Materials (Deerfield Beach, Fla.)|December 24, 2014
Simultaneous in-situ synthesis and characterization of Co@Cu core-shell nanoparticle arraysJoseph T McKeown, Yueying Wu, Jason D Fowlkes, et al.
Journal of Electron Microscopy|June 16, 2010
Quantifying transient states in materials with the dynamic transmission electron microscopeGeoffrey H Campbell, Thomas LaGrange, Judy S Kim, et al.
Ultramicroscopy|September 12, 2008
Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)Thomas LaGrange, Geoffrey H Campbell, B W Reed, et al.
The Review of Scientific Instruments|September 1, 2014
Combining nanocalorimetry and dynamic transmission electron microscopy for in situ characterization of materials processes under rapid heating and coolingMichael D Grapes, Thomas LaGrange, Lawrence H Friedman, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|November 14, 2012
Real-time observation of nanosecond liquid-phase assembly of nickel nanoparticles via pulsed-laser heatingJoseph T McKeown, Nicholas A Roberts, Jason D Fowlkes, et al.
Science (New York, N.Y.)|September 13, 2008
Imaging of transient structures using nanosecond in situ TEMJudy S Kim, Thomas Lagrange, Bryan W Reed, et al.
Micron (Oxford, England : 1993)|May 19, 2012
Approaches for ultrafast imaging of transient materials processes in the transmission electron microscopeThomas LaGrange, Bryan W Reed, Melissa K Santala, et al.
Microscopy Research and Technique|January 24, 2009
Laser-based in situ techniques: novel methods for generating extreme conditions in TEM samplesMitra L Taheri, Thomas Lagrange, Bryan W Reed, et al.
Ultramicroscopy|December 16, 2006
Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopyMichael R Armstrong, Ken Boyden, Nigel D Browning, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Advanced Materials (Deerfield Beach, Fla.)|December 24, 2014
Simultaneous in-situ synthesis and characterization of Co@Cu core-shell nanoparticle arraysJoseph T McKeown, Yueying Wu, Jason D Fowlkes, et al.
Journal of Electron Microscopy|June 16, 2010
Quantifying transient states in materials with the dynamic transmission electron microscopeGeoffrey H Campbell, Thomas LaGrange, Judy S Kim, et al.
Ultramicroscopy|September 12, 2008
Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)Thomas LaGrange, Geoffrey H Campbell, B W Reed, et al.
The Review of Scientific Instruments|September 1, 2014
Combining nanocalorimetry and dynamic transmission electron microscopy for in situ characterization of materials processes under rapid heating and coolingMichael D Grapes, Thomas LaGrange, Lawrence H Friedman, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|November 14, 2012
Real-time observation of nanosecond liquid-phase assembly of nickel nanoparticles via pulsed-laser heatingJoseph T McKeown, Nicholas A Roberts, Jason D Fowlkes, et al.
Science (New York, N.Y.)|September 13, 2008
Imaging of transient structures using nanosecond in situ TEMJudy S Kim, Thomas Lagrange, Bryan W Reed, et al.
Micron (Oxford, England : 1993)|May 19, 2012
Approaches for ultrafast imaging of transient materials processes in the transmission electron microscopeThomas LaGrange, Bryan W Reed, Melissa K Santala, et al.
Microscopy Research and Technique|January 24, 2009
Laser-based in situ techniques: novel methods for generating extreme conditions in TEM samplesMitra L Taheri, Thomas Lagrange, Bryan W Reed, et al.
Ultramicroscopy|December 16, 2006
Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopyMichael R Armstrong, Ken Boyden, Nigel D Browning, et al.
Pageof 1