Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Giessibl

Showing results (11-20 of 69) with videos related to

Pageof 7
Sort By:
Science (New York, N.Y.)|April 28, 2012
Revealing the angular symmetry of chemical bonds by atomic force microscopyJoachim Welker, Franz J Giessibl
Physical Review Letters|July 16, 2013
Spin resolution and evidence for superexchange on NiO(001) observed by force microscopyFlorian Pielmeier, Franz J Giessibl
Journal of Physics. Condensed Matter : an Institute of Physics Journal|February 8, 2012
Non-contact AFMFranz J Giessibl, Seizo Morita
Science (New York, N.Y.)|September 12, 2024
Decoding the surface of a complex oxideFranz J Giessibl, Alfred John Weymouth
Science (New York, N.Y.)|June 12, 2004
Force microscopy with light-atom probesStefan Hembacher, Franz J Giessibl, Jochen Mannhart
The Review of Scientific Instruments|August 2, 2013
Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllersT Wutscher, J Niebauer, F J Giessibl
Proceedings of the National Academy of Sciences of the United States of America|August 29, 2002
Friction traced to the single atomFranz J Giessibl, Markus Herz, Jochen Mannhart
Beilstein Journal of Nanotechnology|April 13, 2012
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopyJoachim Welker, Esther Illek, Franz J Giessibl
Physical Review Letters|March 4, 2014
Chemical and crystallographic characterization of the tip apex in scanning probe microscopyThomas Hofmann, Florian Pielmeier, Franz J Giessibl
The Journal of Chemical Physics|November 1, 2023
Electrochemical AFM/STM with a qPlus sensor: A versatile tool to study solid-liquid interfacesAndrea Auer, Bernhard Eder, Franz J Giessibl
Pageof 7

Showing results (11-20 of 69) with videos related to

Sort By:
Pageof 7
Science (New York, N.Y.)|April 28, 2012
Revealing the angular symmetry of chemical bonds by atomic force microscopyJoachim Welker, Franz J Giessibl
Physical Review Letters|July 16, 2013
Spin resolution and evidence for superexchange on NiO(001) observed by force microscopyFlorian Pielmeier, Franz J Giessibl
Journal of Physics. Condensed Matter : an Institute of Physics Journal|February 8, 2012
Non-contact AFMFranz J Giessibl, Seizo Morita
Science (New York, N.Y.)|September 12, 2024
Decoding the surface of a complex oxideFranz J Giessibl, Alfred John Weymouth
Science (New York, N.Y.)|June 12, 2004
Force microscopy with light-atom probesStefan Hembacher, Franz J Giessibl, Jochen Mannhart
The Review of Scientific Instruments|August 2, 2013
Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllersT Wutscher, J Niebauer, F J Giessibl
Proceedings of the National Academy of Sciences of the United States of America|August 29, 2002
Friction traced to the single atomFranz J Giessibl, Markus Herz, Jochen Mannhart
Beilstein Journal of Nanotechnology|April 13, 2012
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopyJoachim Welker, Esther Illek, Franz J Giessibl
Physical Review Letters|March 4, 2014
Chemical and crystallographic characterization of the tip apex in scanning probe microscopyThomas Hofmann, Florian Pielmeier, Franz J Giessibl
The Journal of Chemical Physics|November 1, 2023
Electrochemical AFM/STM with a qPlus sensor: A versatile tool to study solid-liquid interfacesAndrea Auer, Bernhard Eder, Franz J Giessibl
Pageof 7