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Applied Optics|July 27, 2002
High-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopyVincent R Daria, Jelda J Miranda, Caesar SalomaOptics Letters|December 9, 2004
High-contrast microscopy of semiconductor and metal sites in integrated circuits by detection of optical feedbackVernon Julius Cemine, Bernardino Buenaobra, Carlo Mar Blanca, et al.Optics Express|June 9, 2009
Spectral microthermography for component discrimination and hot spot identification in integrated circuitsGodofredo Bautista, Carlo Mar Blanca, Serafin Delica, et al.Optics Letters|April 2, 2014
Independent light fields generated using a phase-only spatial light modulatorPaul Leonard Hilario, Mark Jayson Villangca, Giovanni TapangApplied Optics|November 2, 2007
Fault localization and analysis in semiconductor devices with optical-feedback infrared confocal microscopyRaymund Sarmiento, Vernon Julius Cemine, Imee Rose Tagaca, et al.Plos One|February 19, 2015
Prior individual training and self-organized queuing during group emergency escape of mice from water poolCaesar Saloma, Gay Jane Perez, Catherine Ann Gavile, et al.Pageof 3