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Ultramicroscopy|March 31, 2000
Piezoresistive sensors for scanning probe microscopyGotszalk, Grabiec, RangelowMicron (Oxford, England : 1993)|February 2, 2023
Ion microsource integrated with scanning electron microscope for sample preparationW Slówko, T GotszalkUltramicroscopy|April 1, 2014
Investigation of multi-junction solar cells using electrostatic force microscopy methodsM Moczała, N Sosa, A Topol, et al.Ultramicroscopy|June 26, 2012
Regularization mechanism in blind tip reconstruction procedureG Jóźwiak, A Henrykowski, A Masalska, et al.Ultramicroscopy|June 13, 2003
Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopyTeodor Gotszalk, Piotr Grabiec, Ivo W RangelowUltramicroscopy|August 13, 2013
Thermal mapping of a scanning thermal microscopy tipGrzegorz Jóźwiak, Grzegorz Wielgoszewski, Teodor Gotszalk, et al.The Review of Scientific Instruments|May 3, 2018
Metrological 2iOF fibre-optic system for position and displacement measurement with 31 pm resolutionKarolina Orłowska, Michał Świątkowski, Piotr Kunicki, et al.Ultramicroscopy|June 13, 2003
Quantum size aspects of the piezoresistive effect in ultra thin piezoresistorsTzv Ivanov, T Gotszalk, T Sulzbach, et al.Scientific Reports|February 18, 2024
Wavelet-based information theory in quantitative assessment of AFM images' qualityBartosz Czesław Pruchnik, Piotr Adam Putek, Teodor Paweł GotszalkApplied Optics|August 10, 2016
High-resolution and wide-bandwidth light intensity fiber optic displacement sensor for MEMS metrologyKarolina Orłowska, Michał Świątkowski, Piotr Kunicki, et al.Pageof 6