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Grigore Moldovan

Showing results (1-10 of 7) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
InFluence: An Open-Source Python Package to Model Images Captured with Direct Electron DetectorsGearóid Liam Mangan, Grigore Moldovan, Andrew Stewart
Microscopy (Oxford, England)|May 12, 2026
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEMJonathan J P Peters, Grigore Moldovan, Lewys Jones
Microscopy (Oxford, England)|January 10, 2014
Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensorLionel C Gontard, Grigore Moldovan, Ricardo Carmona-Galán, et al.
Physical Review Letters|August 27, 2013
Direct detection of electron backscatter diffraction patternsAngus J Wilkinson, Grigore Moldovan, T Benjamin Britton, et al.
Ultramicroscopy|November 28, 2006
Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devicesGrigore Moldovan, Payam Kazemian, Paul R Edwards, et al.
Nanotechnology|October 11, 2021
Thermally propagated Al contacts on SiGe nanowires characterized by electron beam induced current in a scanning transmission electron microscopeAidan P Conlan, Minh Anh Luong, Pascal Gentile, et al.
Ultramicroscopy|April 13, 2010
Characterization of a direct detection device imaging camera for transmission electron microscopyAnna-Clare Milazzo, Grigore Moldovan, Jason Lanman, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
InFluence: An Open-Source Python Package to Model Images Captured with Direct Electron DetectorsGearóid Liam Mangan, Grigore Moldovan, Andrew Stewart
Microscopy (Oxford, England)|May 12, 2026
Dynamic Scan Shaping: Overcoming Coil Hysteresis for High-Speed STEMJonathan J P Peters, Grigore Moldovan, Lewys Jones
Microscopy (Oxford, England)|January 10, 2014
Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensorLionel C Gontard, Grigore Moldovan, Ricardo Carmona-Galán, et al.
Physical Review Letters|August 27, 2013
Direct detection of electron backscatter diffraction patternsAngus J Wilkinson, Grigore Moldovan, T Benjamin Britton, et al.
Ultramicroscopy|November 28, 2006
Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devicesGrigore Moldovan, Payam Kazemian, Paul R Edwards, et al.
Nanotechnology|October 11, 2021
Thermally propagated Al contacts on SiGe nanowires characterized by electron beam induced current in a scanning transmission electron microscopeAidan P Conlan, Minh Anh Luong, Pascal Gentile, et al.
Ultramicroscopy|April 13, 2010
Characterization of a direct detection device imaging camera for transmission electron microscopyAnna-Clare Milazzo, Grigore Moldovan, Jason Lanman, et al.
Pageof 1