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Grzegorz Cios

Showing results (1-10 of 25) with videos related to

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Materials (Basel, Switzerland)|October 10, 2020
Synthesis and Characterization of Cu<sub>2</sub>FeSnS<sub>4</sub>-Cu<sub>2</sub>MnSnS<sub>4</sub> Solid Solution MicrospheresEdyta Waluś, Maciej Manecki, Grzegorz Cios
Materials (Basel, Switzerland)|July 2, 2021
Effect of a Sulfur Precursor on the Hydrothermal Synthesis of Cu<sub>2</sub>MnSnS<sub>4</sub>Edyta Waluś, Maciej Manecki, Grzegorz Cios, et al.
Journal of Applied Crystallography|April 14, 2020
Manual measurement of angles in backscattered and transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Grzegorz Cios, et al.
Materials (Basel, Switzerland)|June 27, 2020
Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction MapsAimo Winkelmann, Gert Nolze, Grzegorz Cios, et al.
Materials (Basel, Switzerland)|April 11, 2020
Studies on the Two-Step Aging Process of Fe-Based Shape Memory Single CrystalsMonika Czerny, Grzegorz Cios, Wojciech Maziarz, et al.
Materials (Basel, Switzerland)|April 3, 2021
Numerical Study on the Dependency of Microstructure Morphologies of Pulsed Laser Deposited TiN Thin Films and the Strain Heterogeneities during Mechanical TestingKonrad Perzynski, Grzegorz Cios, Grzegorz Szwachta, et al.
Journal of Applied Crystallography|June 30, 2021
Crystallographic analysis of the lattice metric (<i>CALM</i>) from single electron backscatter diffraction or transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Łukasz Rychłowski, et al.
Materials (Basel, Switzerland)|December 10, 2021
Application of Nanosilicon to the Sintering of Mg-Mg<sub>2</sub>Si Interpenetrating Phases CompositeAnita Olszówka-Myalska, Hanna Myalska, Patryk Wrześniowski, et al.
Ultramicroscopy|September 3, 2021
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratioTomasz Tokarski, Gert Nolze, Aimo Winkelmann, et al.
Ultramicroscopy|September 25, 2024
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometriesGrzegorz Cios, Aimo Winkelmann, Gert Nolze, et al.
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Materials (Basel, Switzerland)|October 10, 2020
Synthesis and Characterization of Cu<sub>2</sub>FeSnS<sub>4</sub>-Cu<sub>2</sub>MnSnS<sub>4</sub> Solid Solution MicrospheresEdyta Waluś, Maciej Manecki, Grzegorz Cios
Materials (Basel, Switzerland)|July 2, 2021
Effect of a Sulfur Precursor on the Hydrothermal Synthesis of Cu<sub>2</sub>MnSnS<sub>4</sub>Edyta Waluś, Maciej Manecki, Grzegorz Cios, et al.
Journal of Applied Crystallography|April 14, 2020
Manual measurement of angles in backscattered and transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Grzegorz Cios, et al.
Materials (Basel, Switzerland)|June 27, 2020
Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction MapsAimo Winkelmann, Gert Nolze, Grzegorz Cios, et al.
Materials (Basel, Switzerland)|April 11, 2020
Studies on the Two-Step Aging Process of Fe-Based Shape Memory Single CrystalsMonika Czerny, Grzegorz Cios, Wojciech Maziarz, et al.
Materials (Basel, Switzerland)|April 3, 2021
Numerical Study on the Dependency of Microstructure Morphologies of Pulsed Laser Deposited TiN Thin Films and the Strain Heterogeneities during Mechanical TestingKonrad Perzynski, Grzegorz Cios, Grzegorz Szwachta, et al.
Journal of Applied Crystallography|June 30, 2021
Crystallographic analysis of the lattice metric (<i>CALM</i>) from single electron backscatter diffraction or transmission Kikuchi diffraction patternsGert Nolze, Tomasz Tokarski, Łukasz Rychłowski, et al.
Materials (Basel, Switzerland)|December 10, 2021
Application of Nanosilicon to the Sintering of Mg-Mg<sub>2</sub>Si Interpenetrating Phases CompositeAnita Olszówka-Myalska, Hanna Myalska, Patryk Wrześniowski, et al.
Ultramicroscopy|September 3, 2021
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratioTomasz Tokarski, Gert Nolze, Aimo Winkelmann, et al.
Ultramicroscopy|September 25, 2024
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometriesGrzegorz Cios, Aimo Winkelmann, Gert Nolze, et al.
Pageof 3