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Guangyi Shang

Showing results (1-10 of 22) with videos related to

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Nanoscale Research Letters|April 28, 2016
In situ Electrochemical-AFM Study of LiFePO4 Thin Film in Aqueous ElectrolyteJiaxiong Wu, Wei Cai, Guangyi Shang
Nanotechnology|June 5, 2024
Accurate detection of subsurface microcavity by bimodal atomic force microscopyPengtao Lou, Zhuanfang Bi, Guangyi Shang
Langmuir : the ACS Journal of Surfaces and Colloids|July 18, 2023
Operando Imaging of Over-Discharge-Induced Surface Morphology Evolutions of LiMn<sub>2</sub>O<sub>4</sub> Submicron-Sized Particles by Electrochemical High-Speed Atomic Force MicroscopyPeifa Yang, Zhuanfang Bi, Guangyi Shang
The Review of Scientific Instruments|August 3, 2022
A novel design for the combination of electrochemical atomic force microscopy and Raman spectroscopy in reflection mode for in situ study of battery materialsXiaoxia Meng, Zhuanfang Bi, Xinru Wang, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|March 17, 2022
Tracking Electrochemical-Cycle-Induced Surface Structure Evolutions of Cathode Material LiMn<sub>2</sub>O<sub>4</sub> with Improved Operando Raman SpectroscopyXiaoxia Meng, Zhuanfang Bi, Pengtao Lou, et al.
The Review of Scientific Instruments|September 7, 2013
Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscopeJianyong Zhao, Weitao Gong, Wei Cai, et al.
Nanoscale Research Letters|January 17, 2015
Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact modeWei Cai, Haiyun Fan, Jianyong Zhao, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|August 8, 2024
Visualization and Quantification of State of Charge-Dependent Young's Modulus of LiMn<sub>2</sub>O<sub>4</sub> Nanosized Particles by Bimodal AFMPengtao Lou, Zhuanfang Bi, Xinru Wang, et al.
The Review of Scientific Instruments|June 3, 2010
Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning rangeYusheng Zhou, Guangyi Shang, Wei Cai, et al.
The Review of Scientific Instruments|January 5, 2011
An alternative flat scanner and micropositioning method for scanning probe microscopeWei Cai, Guangyi Shang, Yusheng Zhou, et al.
Pageof 3

Showing results (1-10 of 22) with videos related to

Sort By:
Pageof 3
Nanoscale Research Letters|April 28, 2016
In situ Electrochemical-AFM Study of LiFePO4 Thin Film in Aqueous ElectrolyteJiaxiong Wu, Wei Cai, Guangyi Shang
Nanotechnology|June 5, 2024
Accurate detection of subsurface microcavity by bimodal atomic force microscopyPengtao Lou, Zhuanfang Bi, Guangyi Shang
Langmuir : the ACS Journal of Surfaces and Colloids|July 18, 2023
Operando Imaging of Over-Discharge-Induced Surface Morphology Evolutions of LiMn<sub>2</sub>O<sub>4</sub> Submicron-Sized Particles by Electrochemical High-Speed Atomic Force MicroscopyPeifa Yang, Zhuanfang Bi, Guangyi Shang
The Review of Scientific Instruments|August 3, 2022
A novel design for the combination of electrochemical atomic force microscopy and Raman spectroscopy in reflection mode for in situ study of battery materialsXiaoxia Meng, Zhuanfang Bi, Xinru Wang, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|March 17, 2022
Tracking Electrochemical-Cycle-Induced Surface Structure Evolutions of Cathode Material LiMn<sub>2</sub>O<sub>4</sub> with Improved Operando Raman SpectroscopyXiaoxia Meng, Zhuanfang Bi, Pengtao Lou, et al.
The Review of Scientific Instruments|September 7, 2013
Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscopeJianyong Zhao, Weitao Gong, Wei Cai, et al.
Nanoscale Research Letters|January 17, 2015
Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact modeWei Cai, Haiyun Fan, Jianyong Zhao, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|August 8, 2024
Visualization and Quantification of State of Charge-Dependent Young's Modulus of LiMn<sub>2</sub>O<sub>4</sub> Nanosized Particles by Bimodal AFMPengtao Lou, Zhuanfang Bi, Xinru Wang, et al.
The Review of Scientific Instruments|June 3, 2010
Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning rangeYusheng Zhou, Guangyi Shang, Wei Cai, et al.
The Review of Scientific Instruments|January 5, 2011
An alternative flat scanner and micropositioning method for scanning probe microscopeWei Cai, Guangyi Shang, Yusheng Zhou, et al.
Pageof 3