Related Experiment Video
Updated: Apr 18, 2026
Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
Published on: June 30, 2023
Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy
Wei Cai1, Haiyun Fan2, Jianyong Zhao3
1Department of Applied Physics, Beihang University, Beijing 100191, People's Republic of China ; Key Laboratory of Micro-nano Measurement-Manipulation and Physics (Ministry of Education), Beihang University, Beijing 100191, People's Republic of China.
Abstract:
We report herein an alternative high-speed scanning force microscopy method in the contact mode based on a resonance-type piezoelectric bimorph scanner. The experimental setup, the modified optical beam deflection scheme suitable for smaller cantilevers, and a high-speed control program for simultaneous data capture are described in detail. The feature of the method is that the deflection and friction force images of the sample surface can be obtained simultaneously in real time. Images of various samples (e.g., a test grating, a thin gold film, and fluorine-doped tin oxide-coated glass slides) are acquired successfully. The imaging rate is 25 frames per second, and the average scan speed reaches a value of approximately 2.5 cm/s. The method combines the advantages of both observing the dynamic processes of the sample surface and monitoring the frictional properties on the nanometer scale.
Pacs:
07.79.Lh; 07.79.Sp; 68.37.Ps.
