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The Review of Scientific Instruments|December 5, 2012
Practical aspects of single-pass scan Kelvin probe force microscopyGuangyong Li, Bin Mao, Fei Lan, et al.
The Review of Scientific Instruments|April 5, 2017
Reconstruction of Kelvin probe force microscopy image with experimentally calibrated point spread functionFei Lan, Minlin Jiang, Quan Tao, et al.
Beilstein Journal of Nanotechnology|February 2, 2017
Tandem polymer solar cells: simulation and optimization through a multiscale schemeFanan Wei, Ligang Yao, Fei Lan, et al.
Nanotechnology|July 15, 2020
Influence of MoS2-metal interface on charge injection: a comparison between various metal contactsMeng Li, Fei Lan, Wenguang Yang, et al.
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