Practical aspects of single-pass scan Kelvin probe force microscopy

Area of Science:

• Surface science
• Scanning probe microscopy
• Nanotechnology

Background:

• Dual-pass lift-up scan Kelvin probe force microscopy (KPFM) is widely used.
• Single-pass scan KPFM in ambient conditions is less explored but offers potential advantages.
• Understanding practical aspects of single-pass KPFM is crucial for its adoption.

Purpose of the Study:

• To discuss practical aspects of single-pass scan KPFM in ambient conditions.
• To analyze the resolution, accuracy, and sensitivity of single-pass KPFM.
• To investigate and minimize crosstalk between topographical and surface potential images.

Main Methods:

• Defining spatial resolution using a point spread function.
• Analyzing the relationship between resolution and scanning parameters (tip apex radius, tip-surface distance).
• Investigating KPFM accuracy, sensitivity, and crosstalk in single-pass mode.

Main Results:

• Single-pass scan KPFM demonstrates potential for higher spatial resolution.
• Topographical errors due to electrostatic forces are minimized.
• Practical methods for minimizing crosstalk between images are demonstrated.

Conclusions:

• Single-pass scan KPFM in ambient conditions presents significant advantages over dual-pass methods.
• The study provides a framework for understanding and optimizing single-pass KPFM performance.
• Practical guidance is offered for researchers utilizing this technique.