Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Gullikson

Showing results (61-70 of 161) with videos related to

Pageof 17
Sort By:
Optics Letters|October 2, 2009
X-ray Schwarzschild objective for the carbon window (lambda approximately 4.5 nm)Igor Artyukov, Yegor Bugayev, Olexander Devizenko, et al.
Optics Letters|November 21, 2007
Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometerChang Chang, Erik Anderson, Patrick Naulleau, et al.
Optics Express|July 24, 2008
Absolute sensitivity calibration of extreme ultraviolet photoresistsPatrick P Naulleau, Eric M Gullikson, Andrew Aquila, et al.
Gastroenterology|November 1, 1991
Cholecystokinin-mediated ileal electrolyte transport in the guinea pig. Characterization of receptor subtypeJ F Kachur, S X Wang, G W Gullikson, et al.
Journal of Synchrotron Radiation|April 26, 2014
Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scatteringEmmanuel O Jonah, Margit Härting, Eric Gullikson, et al.
Optics Express|October 13, 2022
New method for the determination of photoabsorption from transmittance measurements in the extreme ultravioletFranck Delmotte, Catherine Burcklen, Jennifer Alameda, et al.
Optics Express|October 27, 2022
6000 lines/mm blazed grating for a high-resolution x-ray spectrometerD L Voronov, S Park, E M Gullikson, et al.
Optics Express|September 15, 2023
Advanced low blaze angle x-ray gratings via nanoimprint replication and plasma etchDmitriy L Voronov, Sooyeon Park, Eric M Gullikson, et al.
Journal of Synchrotron Radiation|August 22, 2001
Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation thresholdsY Muramatsu, Y Ueno, T A Sasaki, et al.
The Journal of Physical Chemistry. A|January 6, 2012
Chemical-state analysis of organic semiconductors using soft X-ray absorption spectroscopy combined with first-principles calculationYutaka Natsume, Teiichiro Kohno, Takashi Minakata, et al.
Pageof 17

Showing results (61-70 of 161) with videos related to

Sort By:
Pageof 17
Optics Letters|October 2, 2009
X-ray Schwarzschild objective for the carbon window (lambda approximately 4.5 nm)Igor Artyukov, Yegor Bugayev, Olexander Devizenko, et al.
Optics Letters|November 21, 2007
Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometerChang Chang, Erik Anderson, Patrick Naulleau, et al.
Optics Express|July 24, 2008
Absolute sensitivity calibration of extreme ultraviolet photoresistsPatrick P Naulleau, Eric M Gullikson, Andrew Aquila, et al.
Gastroenterology|November 1, 1991
Cholecystokinin-mediated ileal electrolyte transport in the guinea pig. Characterization of receptor subtypeJ F Kachur, S X Wang, G W Gullikson, et al.
Journal of Synchrotron Radiation|April 26, 2014
Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scatteringEmmanuel O Jonah, Margit Härting, Eric Gullikson, et al.
Optics Express|October 13, 2022
New method for the determination of photoabsorption from transmittance measurements in the extreme ultravioletFranck Delmotte, Catherine Burcklen, Jennifer Alameda, et al.
Optics Express|October 27, 2022
6000 lines/mm blazed grating for a high-resolution x-ray spectrometerD L Voronov, S Park, E M Gullikson, et al.
Optics Express|September 15, 2023
Advanced low blaze angle x-ray gratings via nanoimprint replication and plasma etchDmitriy L Voronov, Sooyeon Park, Eric M Gullikson, et al.
Journal of Synchrotron Radiation|August 22, 2001
Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation thresholdsY Muramatsu, Y Ueno, T A Sasaki, et al.
The Journal of Physical Chemistry. A|January 6, 2012
Chemical-state analysis of organic semiconductors using soft X-ray absorption spectroscopy combined with first-principles calculationYutaka Natsume, Teiichiro Kohno, Takashi Minakata, et al.
Pageof 17