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Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation
Y Muramatsu1, Y Ueno, T A Sasaki
1Japan Atomic Energy Research Institute, Sayo-gun, Hyogo, Japan. murama@spring8.or.jp
Journal of Synchrotron Radiation
|August 22, 2001
Summary
Partial-fluorescence-yield (PFY) x-ray absorption spectroscopy reveals electronic structures and radiative decay. This method enhances radiative process-resolved (RPR) analysis for materials like graphite, diamond, and boron nitride.
Area of Science:
- Materials Science
- Atomic and Molecular Physics
- Spectroscopy
Background:
- X-ray absorption spectroscopy (XAS) is crucial for probing electronic structures.
- Optimizing detector window widths in wavelength dispersive x-ray spectrometers is key for advanced XAS techniques.
Purpose of the Study:
- To apply partial-fluorescence-yield (PFY) measurements for radiative process-resolved (RPR) x-ray absorption spectroscopy.
- To investigate the electronic structures and radiative decay processes in graphite, diamond, hexagonal boron nitride (h-BN), and cubic boron nitride (c-BN).
Main Methods:
- Utilized optimized window widths of position sensitive detectors in wavelength dispersive x-ray spectrometers.
- Performed PFY-absorption measurements at the C K-edge for graphite and diamond.
- Conducted PFY-absorption measurements at the B K-edge for h-BN and c-BN.
Main Results:
- Observed resonant elastic x-ray scattering in graphite and h-BN.
- Detected excitonic x-ray scattering in diamond and c-BN.
- PFY-absorption spectra provided insights into electronic structures and radiative decay.
Conclusions:
- PFY-absorption measurements are effective for RPR x-ray absorption spectroscopy.
- This technique offers valuable information on electronic structures and radiative decay processes in inner-shell excitation.
- The study demonstrates the utility of PFY-XAS for characterizing advanced materials.