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H Ade

Showing results (1-10 of 18) with videos related to

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Science (New York, N.Y.)|November 26, 1993
X-ray Linear Dichroism MicroscopyH Ade, B Hsiao
Journal of the American Society for Mass Spectrometry|May 30, 2006
Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometryS E Harton, F A Stevie, H Ade
Analytical Chemistry|May 13, 2006
Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometryS E Harton, F A Stevie, Z Zhu, et al.
The Journal of Chemical Physics|January 19, 2011
Calibrated NEXAFS spectra of common conjugated polymersB Watts, S Swaraj, D Nordlund, et al.
Physical Review Letters|April 12, 2003
Attractive migration and coalescence: a significant process in the coarsening of TiSi2 islands on the Si(111) surfaceW C Yang, M Zeman, H Ade, et al.
The Review of Scientific Instruments|April 8, 2010
Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detectionC Hub, S Wenzel, J Raabe, et al.
Science (New York, N.Y.)|November 6, 1992
Chemical contrast in X-ray microscopy and spatially resolved XANES spectroscopy of organic specimensH Ade, X Zhang, S Cameron, et al.
Nanotechnology|August 12, 2011
Evolution of the nanomorphology of photovoltaic polyfluorene blends: sub-100 nm resolution with x-ray spectromicroscopyC R McNeill, B Watts, S Swaraj, et al.
The Review of Scientific Instruments|May 8, 2012
Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysisE Gann, A T Young, B A Collins, et al.
Biochimica Et Biophysica Acta|June 27, 1989
The interior of a whole and unmodified biological object--the zymogen granule--viewed with a high-resolution X-ray microscopeS S Rothman, N Iskander, D Attwood, et al.
Pageof 2

Showing results (1-10 of 18) with videos related to

Sort By:
Pageof 2
Science (New York, N.Y.)|November 26, 1993
X-ray Linear Dichroism MicroscopyH Ade, B Hsiao
Journal of the American Society for Mass Spectrometry|May 30, 2006
Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometryS E Harton, F A Stevie, H Ade
Analytical Chemistry|May 13, 2006
Carbon-13 labeled polymers: an alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometryS E Harton, F A Stevie, Z Zhu, et al.
The Journal of Chemical Physics|January 19, 2011
Calibrated NEXAFS spectra of common conjugated polymersB Watts, S Swaraj, D Nordlund, et al.
Physical Review Letters|April 12, 2003
Attractive migration and coalescence: a significant process in the coarsening of TiSi2 islands on the Si(111) surfaceW C Yang, M Zeman, H Ade, et al.
The Review of Scientific Instruments|April 8, 2010
Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detectionC Hub, S Wenzel, J Raabe, et al.
Science (New York, N.Y.)|November 6, 1992
Chemical contrast in X-ray microscopy and spatially resolved XANES spectroscopy of organic specimensH Ade, X Zhang, S Cameron, et al.
Nanotechnology|August 12, 2011
Evolution of the nanomorphology of photovoltaic polyfluorene blends: sub-100 nm resolution with x-ray spectromicroscopyC R McNeill, B Watts, S Swaraj, et al.
The Review of Scientific Instruments|May 8, 2012
Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysisE Gann, A T Young, B A Collins, et al.
Biochimica Et Biophysica Acta|June 27, 1989
The interior of a whole and unmodified biological object--the zymogen granule--viewed with a high-resolution X-ray microscopeS S Rothman, N Iskander, D Attwood, et al.
Pageof 2