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H Diesinger

Showing results (1-10 of 8) with videos related to

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Journal of Microscopy|April 12, 2001
Near-field optics on silicon-electrolyte junctionsH Diesinger, A Bsiesy, R Hérino, et al.
Physical Review Letters|June 1, 2004
Probing nanoscale dipole-dipole interactions by electric force microscopyT Mélin, H Diesinger, D Deresmes, et al.
Ultramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.
Ultramicroscopy|March 18, 2008
Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setupH Diesinger, D Deresmes, J-P Nys, et al.
The Review of Scientific Instruments|April 5, 2011
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopyT Mélin, S Barbet, H Diesinger, et al.
The Review of Scientific Instruments|June 7, 2012
Enhancing photocurrent transient spectroscopy by electromagnetic modelingH Diesinger, M Panahandeh-Fard, Z Wang, et al.
Physical Review Letters|February 21, 2006
Comment on "electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy"M Zdrojek, T Mélin, H Diesinger, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 22, 2017
Deformation Localization in Molecular Layers Constrained between Self-Assembled Au NanoparticlesG Copie, M Biaye, H Diesinger, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|April 12, 2001
Near-field optics on silicon-electrolyte junctionsH Diesinger, A Bsiesy, R Hérino, et al.
Physical Review Letters|June 1, 2004
Probing nanoscale dipole-dipole interactions by electric force microscopyT Mélin, H Diesinger, D Deresmes, et al.
Ultramicroscopy|November 27, 2009
Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuumH Diesinger, D Deresmes, J-P Nys, et al.
Ultramicroscopy|March 18, 2008
Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setupH Diesinger, D Deresmes, J-P Nys, et al.
The Review of Scientific Instruments|April 5, 2011
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopyT Mélin, S Barbet, H Diesinger, et al.
The Review of Scientific Instruments|June 7, 2012
Enhancing photocurrent transient spectroscopy by electromagnetic modelingH Diesinger, M Panahandeh-Fard, Z Wang, et al.
Physical Review Letters|February 21, 2006
Comment on "electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy"M Zdrojek, T Mélin, H Diesinger, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 22, 2017
Deformation Localization in Molecular Layers Constrained between Self-Assembled Au NanoparticlesG Copie, M Biaye, H Diesinger, et al.
Pageof 1