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H W Schnopper

Applied optics

Showing results (1-10 of 7) with videos related to

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Applied Optics|March 24, 2010
Bragg reflection concentrators for hard x-ray astronomyH W Schnopper
Applied Optics|May 22, 2010
Bragg imaging of extended cosmic x-ray sources: the objective crystal spectrometerH W Schnopper, B P Byrnak
Applied Optics|March 18, 2010
Spherical crystal imaging spectrometer (SCIS) for cosmic x-ray spectroscopyH W Schnopper, P O Taylor
Applied Optics|June 10, 2010
Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a triple-axis x-ray diffractometerF E Christensen, A Hornstrup, H W Schnopper
Applied Optics|May 11, 2010
Measurements of mosaicity and perfection of crystallites in commercially available crystals using a 4-axis perfect-crystal x-ray diffractometerF E Christensen, K P Singh, N J Westergaard, et al.
Applied Optics|August 14, 2010
Electron micrography and x-ray study of dip-lacquered LiF (220)J Palmari, M Rasigni, G Rasigni, et al.
Applied Optics|February 20, 2010
Diffraction grating transmission efficiencies for XUV and soft x raysH W Schnopper, L P Van Speybroeck, J P Delvaille, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|March 24, 2010
Bragg reflection concentrators for hard x-ray astronomyH W Schnopper
Applied Optics|May 22, 2010
Bragg imaging of extended cosmic x-ray sources: the objective crystal spectrometerH W Schnopper, B P Byrnak
Applied Optics|March 18, 2010
Spherical crystal imaging spectrometer (SCIS) for cosmic x-ray spectroscopyH W Schnopper, P O Taylor
Applied Optics|June 10, 2010
Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a triple-axis x-ray diffractometerF E Christensen, A Hornstrup, H W Schnopper
Applied Optics|May 11, 2010
Measurements of mosaicity and perfection of crystallites in commercially available crystals using a 4-axis perfect-crystal x-ray diffractometerF E Christensen, K P Singh, N J Westergaard, et al.
Applied Optics|August 14, 2010
Electron micrography and x-ray study of dip-lacquered LiF (220)J Palmari, M Rasigni, G Rasigni, et al.
Applied Optics|February 20, 2010
Diffraction grating transmission efficiencies for XUV and soft x raysH W Schnopper, L P Van Speybroeck, J P Delvaille, et al.
Pageof 1