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Showing results (31-40 of 36) with videos related to

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Micromachines|August 27, 2021
Sensing Circuit Design Techniques for RRAM in Advanced CMOS Technology NodesDonglin Zhang, Bo Peng, Yulin Zhao, et al.
Nanoscale Research Letters|April 9, 2015
Impact of program/erase operation on the performances of oxide-based resistive switching memoryGuoming Wang, Shibing Long, Zhaoan Yu, et al.
Micromachines|June 24, 2022
Probabilistic Circuit Implementation Based on P-Bits Using the Intrinsic Random Property of RRAM and P-Bit Multiplexing StrategyYixuan Liu, Qiao Hu, Qiqiao Wu, et al.
Advanced Materials (Deerfield Beach, Fla.)|February 14, 2018
Breaking the Current-Retention Dilemma in Cation-Based Resistive Switching Devices Utilizing Graphene with Controlled DefectsXiaolong Zhao, Jun Ma, Xiangheng Xiao, et al.
Nature Communications|December 14, 2021
Evolution of the conductive filament system in HfO<sub>2</sub>-based memristors observed by direct atomic-scale imagingYing Zhang, Ge-Qi Mao, Xiaolong Zhao, et al.
Nature Communications|March 15, 2020
A highly CMOS compatible hafnia-based ferroelectric diodeQing Luo, Yan Cheng, Jianguo Yang, et al.
Pageof 4

Showing results (31-40 of 36) with videos related to

Sort By:
Pageof 4
You have reached the last page of results.This site can display upto 36 results.
Micromachines|August 27, 2021
Sensing Circuit Design Techniques for RRAM in Advanced CMOS Technology NodesDonglin Zhang, Bo Peng, Yulin Zhao, et al.
Nanoscale Research Letters|April 9, 2015
Impact of program/erase operation on the performances of oxide-based resistive switching memoryGuoming Wang, Shibing Long, Zhaoan Yu, et al.
Micromachines|June 24, 2022
Probabilistic Circuit Implementation Based on P-Bits Using the Intrinsic Random Property of RRAM and P-Bit Multiplexing StrategyYixuan Liu, Qiao Hu, Qiqiao Wu, et al.
Advanced Materials (Deerfield Beach, Fla.)|February 14, 2018
Breaking the Current-Retention Dilemma in Cation-Based Resistive Switching Devices Utilizing Graphene with Controlled DefectsXiaolong Zhao, Jun Ma, Xiangheng Xiao, et al.
Nature Communications|December 14, 2021
Evolution of the conductive filament system in HfO<sub>2</sub>-based memristors observed by direct atomic-scale imagingYing Zhang, Ge-Qi Mao, Xiaolong Zhao, et al.
Nature Communications|March 15, 2020
A highly CMOS compatible hafnia-based ferroelectric diodeQing Luo, Yan Cheng, Jianguo Yang, et al.
Pageof 4