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Hendrix Demers

Showing results (1-10 of 32) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
X-ray microanalysis of a coated nonconductive specimen: Monte Carlo simulationHendrix Demers, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 11, 2012
Spatial resolution optimization of backscattered electron images using Monte Carlo simulationCamille Probst, Hendrix Demers, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2019
High Speed Matrix Corrections for Quantitative X-ray Microanalysis Based on Monte Carlo Simulated K-Ratio IntensitiesJohn Donovan, Philippe Pinard, Hendrix Demers
Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 29, 2013
Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltageNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Applied Physics Letters|March 31, 2011
Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranesRanjan Ramachandra, Hendrix Demers, Niels de Jonge
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
The Influence of Beam Broadening on the Spatial Resolution of Annular Dark Field Scanning Transmission Electron MicroscopyNiels de Jonge, Andreas Verch, Hendrix Demers
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 8, 2013
The influence of the sample thickness on the lateral and axial resolution of aberration-corrected scanning transmission electron microscopyRanjan Ramachandra, Hendrix Demers, Niels de Jonge
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2019
Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer MaterialsYu Yuan, Hendrix Demers, Samantha Rudinsky, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 28, 2020
Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid ModelYu Yuan, Hendrix Demers, Xianglong Wang, et al.
Pageof 4

Showing results (1-10 of 32) with videos related to

Sort By:
Pageof 4
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
X-ray microanalysis of a coated nonconductive specimen: Monte Carlo simulationHendrix Demers, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 11, 2012
Spatial resolution optimization of backscattered electron images using Monte Carlo simulationCamille Probst, Hendrix Demers, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2019
High Speed Matrix Corrections for Quantitative X-ray Microanalysis Based on Monte Carlo Simulated K-Ratio IntensitiesJohn Donovan, Philippe Pinard, Hendrix Demers
Ultramicroscopy|December 3, 2014
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscopeNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 29, 2013
Dark-field imaging of thin specimens with a forescatter electron detector at low accelerating voltageNicolas Brodusch, Hendrix Demers, Raynald Gauvin
Applied Physics Letters|March 31, 2011
Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranesRanjan Ramachandra, Hendrix Demers, Niels de Jonge
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 28, 2018
The Influence of Beam Broadening on the Spatial Resolution of Annular Dark Field Scanning Transmission Electron MicroscopyNiels de Jonge, Andreas Verch, Hendrix Demers
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 8, 2013
The influence of the sample thickness on the lateral and axial resolution of aberration-corrected scanning transmission electron microscopyRanjan Ramachandra, Hendrix Demers, Niels de Jonge
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2019
Secondary Fluorescence Correction for Characteristic and Bremsstrahlung X-Rays Using Monte Carlo X-ray Depth Distributions Applied to Bulk and Multilayer MaterialsYu Yuan, Hendrix Demers, Samantha Rudinsky, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 28, 2020
Secondary Fluorescence of 3D Heterogeneous Materials Using a Hybrid ModelYu Yuan, Hendrix Demers, Xianglong Wang, et al.
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