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X-ray microanalysis of a coated nonconductive specimen: Monte Carlo simulation

Hendrix Demers1, Raynald Gauvin

  • 1Department of Mining, Metals and Materials Engineering, McGill University, Montréal H3A 2B2, Canada. hendrix.demers@mail.mcgill.ca

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 29, 2009
PubMed

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