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Henry Baltes

Showing results (1-10 of 6) with videos related to

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The Analyst|February 8, 2003
CMOS-based chemical microsensorsAndreas Hierlemann, Henry Baltes
Analytical Chemistry|May 1, 2004
Tuning sensitivity and selectivity of complementary metal oxide semiconductor-based capacitive chemical microsensorsAdrian M Kummer, Andreas Hierlemann, Henry Baltes
Analytical Chemistry|July 27, 2002
Complementary metal oxide semiconductor cantilever arrays on a single chip: mass-sensitive detection of volatile organic compoundsDirk Lange, Christoph Hagleitner, Andreas Hierlemann, et al.
Ultramicroscopy|September 5, 2002
A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible atomic force microscopy tip fabrication process and integrated atomic force microscopy cantilevers fabricated with this processMizuki Ono, Dirk Lange, Oliver Brand, et al.
Analytical Chemistry|July 31, 2004
Metal oxide-based monolithic complementary metal oxide semiconductor gas sensor microsystemMarkus Graf, Diego Barrettino, Stefano Taschini, et al.
Analytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|March 5, 2002
Using reactands in CMOS-based calorimetric sensors: new functional materials for electronic nosesGerhard J Mohr, Gleb Zhylyak, Tomas Nezel, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
The Analyst|February 8, 2003
CMOS-based chemical microsensorsAndreas Hierlemann, Henry Baltes
Analytical Chemistry|May 1, 2004
Tuning sensitivity and selectivity of complementary metal oxide semiconductor-based capacitive chemical microsensorsAdrian M Kummer, Andreas Hierlemann, Henry Baltes
Analytical Chemistry|July 27, 2002
Complementary metal oxide semiconductor cantilever arrays on a single chip: mass-sensitive detection of volatile organic compoundsDirk Lange, Christoph Hagleitner, Andreas Hierlemann, et al.
Ultramicroscopy|September 5, 2002
A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible atomic force microscopy tip fabrication process and integrated atomic force microscopy cantilevers fabricated with this processMizuki Ono, Dirk Lange, Oliver Brand, et al.
Analytical Chemistry|July 31, 2004
Metal oxide-based monolithic complementary metal oxide semiconductor gas sensor microsystemMarkus Graf, Diego Barrettino, Stefano Taschini, et al.
Analytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|March 5, 2002
Using reactands in CMOS-based calorimetric sensors: new functional materials for electronic nosesGerhard J Mohr, Gleb Zhylyak, Tomas Nezel, et al.
Pageof 1