Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Hiroo Omi

Showing results (1-10 of 10) with videos related to

Pageof 1
Sort By:
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 10, 2011
Depth-selective structural analysis of thin films using total-external-reflection x-ray diffractionTomoaki Kawamura, Hiroo Omi
Physical Review Letters|August 16, 2006
Scaling and universality of roughening in thermal oxidation of Si(001)Hiroo Omi, Hiroyuki Kageshima, Masashi Uematsu
Optics Letters|August 19, 2008
On the role of substrate in light-harvesting experimentsIlya Sychugov, Hiroo Omi, Yoshihiro Kobayashi
Nanoscale Research Letters|August 13, 2014
Scandium effect on the luminescence of Er-Sc silicates prepared from multi-nanolayer filmsAdel Najar, Hiroo Omi, Takehiko Tawara
Nanotechnology|May 8, 2009
Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscopeIlya Sychugov, Hiroo Omi, Tooru Murashita, et al.
Physical Review Letters|December 31, 2005
New types of unstable step-flow growth on Si(111)-(7 x 7) during molecular beam epitaxy: scaling and universalityHiroo Omi, Yoshikazu Homma, Vesselin Tonchev, et al.
Optics Express|March 4, 2020
Highly sensitive transient reflection measurement in extreme ultraviolet region for tracking carrier and coherent phonon dynamicsKeiko Kato, Hiroki Mashiko, Yoji Kunihashi, et al.
Physical Review Letters|July 5, 2002
Atomic structures of the Ge/Si(113)-(2 x 2) surfaceZhaohui Zhang, Koji Sumitomo, Hiroo Omi, et al.
Optics Letters|October 16, 2019
Optical coherent transients in <sup>167</sup>Er<sup>3+</sup> at telecom-band wavelengthMasaya Hiraishi, Mark IJspeert, Takehiko Tawara, et al.
Optics Express|May 15, 2020
Epitaxial single-crystal rare-earth oxide in horizontal slot waveguide for silicon-based integrated active photonic devicesXuejun Xu, Viviana Fili, Wojciech Szuba, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 10, 2011
Depth-selective structural analysis of thin films using total-external-reflection x-ray diffractionTomoaki Kawamura, Hiroo Omi
Physical Review Letters|August 16, 2006
Scaling and universality of roughening in thermal oxidation of Si(001)Hiroo Omi, Hiroyuki Kageshima, Masashi Uematsu
Optics Letters|August 19, 2008
On the role of substrate in light-harvesting experimentsIlya Sychugov, Hiroo Omi, Yoshihiro Kobayashi
Nanoscale Research Letters|August 13, 2014
Scandium effect on the luminescence of Er-Sc silicates prepared from multi-nanolayer filmsAdel Najar, Hiroo Omi, Takehiko Tawara
Nanotechnology|May 8, 2009
Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscopeIlya Sychugov, Hiroo Omi, Tooru Murashita, et al.
Physical Review Letters|December 31, 2005
New types of unstable step-flow growth on Si(111)-(7 x 7) during molecular beam epitaxy: scaling and universalityHiroo Omi, Yoshikazu Homma, Vesselin Tonchev, et al.
Optics Express|March 4, 2020
Highly sensitive transient reflection measurement in extreme ultraviolet region for tracking carrier and coherent phonon dynamicsKeiko Kato, Hiroki Mashiko, Yoji Kunihashi, et al.
Physical Review Letters|July 5, 2002
Atomic structures of the Ge/Si(113)-(2 x 2) surfaceZhaohui Zhang, Koji Sumitomo, Hiroo Omi, et al.
Optics Letters|October 16, 2019
Optical coherent transients in <sup>167</sup>Er<sup>3+</sup> at telecom-band wavelengthMasaya Hiraishi, Mark IJspeert, Takehiko Tawara, et al.
Optics Express|May 15, 2020
Epitaxial single-crystal rare-earth oxide in horizontal slot waveguide for silicon-based integrated active photonic devicesXuejun Xu, Viviana Fili, Wojciech Szuba, et al.
Pageof 1