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Holger Fleckenstein

Showing results (1-10 of 36) with videos related to

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Faraday Discussions|November 22, 2014
Non-negative matrix analysis for effective feature extraction in X-ray spectromicroscopyRachel Mak, Mirna Lerotic, Holger Fleckenstein, et al.
The Review of Scientific Instruments|August 3, 2022
Precise wavefront characterization of x-ray optical elements using a laboratory sourceJ Lukas Dresselhaus, Holger Fleckenstein, Martin Domaracký, et al.
Optics Express|October 14, 2022
Robust ptychographic X-ray speckle tracking with multilayer Laue lensesNikolay Ivanov, J Lukas Dresselhaus, Jerome Carnis, et al.
Light, Science & Applications|May 29, 2023
Dose-efficient scanning Compton X-ray microscopyTang Li, J Lukas Dresselhaus, Nikolay Ivanov, et al.
Optics Express|June 11, 2024
X-ray focusing below 3 nm with aberration-corrected multilayer Laue lensesJ Lukas Dresselhaus, Margarita Zakharova, Nikolay Ivanov, et al.
Optics Express|November 22, 2024
Fast and efficient hard X-ray projection imaging below 10 nm resolutionWenhui Zhang, J Lukas Dresselhaus, Holger Fleckenstein, et al.
Structural Dynamics (Melville, N.Y.)|January 16, 2025
Convergent-beam attosecond x-ray crystallographyHenry N Chapman, Chufeng Li, Saša Bajt, et al.
Optics Express|July 30, 2025
Focusing of X-ray free-electron laser pulses using multilayer Laue lensesMargarita Zakharova, Jia Chyi Wong, J Lukas Dresselhaus, et al.
Journal of Applied Crystallography|August 14, 2020
Ptychographic X-ray speckle tracking with multi-layer Laue lens systemsAndrew J Morgan, Kevin T Murray, Mauro Prasciolu, et al.
Journal of Synchrotron Radiation|November 2, 2017
Post-sample aperture for low background diffraction experiments at X-ray free-electron lasersMax O Wiedorn, Salah Awel, Andrew J Morgan, et al.
Pageof 4

Showing results (1-10 of 36) with videos related to

Sort By:
Pageof 4
Faraday Discussions|November 22, 2014
Non-negative matrix analysis for effective feature extraction in X-ray spectromicroscopyRachel Mak, Mirna Lerotic, Holger Fleckenstein, et al.
The Review of Scientific Instruments|August 3, 2022
Precise wavefront characterization of x-ray optical elements using a laboratory sourceJ Lukas Dresselhaus, Holger Fleckenstein, Martin Domaracký, et al.
Optics Express|October 14, 2022
Robust ptychographic X-ray speckle tracking with multilayer Laue lensesNikolay Ivanov, J Lukas Dresselhaus, Jerome Carnis, et al.
Light, Science & Applications|May 29, 2023
Dose-efficient scanning Compton X-ray microscopyTang Li, J Lukas Dresselhaus, Nikolay Ivanov, et al.
Optics Express|June 11, 2024
X-ray focusing below 3 nm with aberration-corrected multilayer Laue lensesJ Lukas Dresselhaus, Margarita Zakharova, Nikolay Ivanov, et al.
Optics Express|November 22, 2024
Fast and efficient hard X-ray projection imaging below 10 nm resolutionWenhui Zhang, J Lukas Dresselhaus, Holger Fleckenstein, et al.
Structural Dynamics (Melville, N.Y.)|January 16, 2025
Convergent-beam attosecond x-ray crystallographyHenry N Chapman, Chufeng Li, Saša Bajt, et al.
Optics Express|July 30, 2025
Focusing of X-ray free-electron laser pulses using multilayer Laue lensesMargarita Zakharova, Jia Chyi Wong, J Lukas Dresselhaus, et al.
Journal of Applied Crystallography|August 14, 2020
Ptychographic X-ray speckle tracking with multi-layer Laue lens systemsAndrew J Morgan, Kevin T Murray, Mauro Prasciolu, et al.
Journal of Synchrotron Radiation|November 2, 2017
Post-sample aperture for low background diffraction experiments at X-ray free-electron lasersMax O Wiedorn, Salah Awel, Andrew J Morgan, et al.
Pageof 4