Search research articles
Contact Us
Filters
Showing results (1-10 of 5) with videos related to
Page
of 1
Sort By:
Applied Optics
|
February 2, 2010
Thickness measurement system for transparent plates using dual digital versatile disc (DVD) pickups
Chien-Hung Liu, Shien-Chang Yeh, Hsueh-Liang Huang
Applied Optics
|
May 9, 2009
Five-degrees-of-freedom diffractive laser encoder
Chien-Hung Liu, Hsueh-Liang Huang, Hau-Wei Lee
The Review of Scientific Instruments
|
April 3, 2014
Development of a machine for automatically measuring static/dynamic running parallelism in linear guideways
Tung-Hsien Hsieh, Hsueh-Liang Huang, Wen-Yuh Jywe, et al.
The Review of Scientific Instruments
|
June 7, 2011
Note: Development of a high resolution six-degrees-of-freedom optical vibrometer for precision stage
Tung Hsien Hsieh, Wen Yuh Jywe, Shang Liang Chen, et al.
The Review of Scientific Instruments
|
July 7, 2007
Development of a three-degree-of-freedom laser linear encoder for error measurement of a high precision stage
Hsueh-Liang Huang, Chien-Hung Liu, Wen-Yuh Jywe, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Applied Optics
|
February 2, 2010
Thickness measurement system for transparent plates using dual digital versatile disc (DVD) pickups
Chien-Hung Liu, Shien-Chang Yeh, Hsueh-Liang Huang
Applied Optics
|
May 9, 2009
Five-degrees-of-freedom diffractive laser encoder
Chien-Hung Liu, Hsueh-Liang Huang, Hau-Wei Lee
The Review of Scientific Instruments
|
April 3, 2014
Development of a machine for automatically measuring static/dynamic running parallelism in linear guideways
Tung-Hsien Hsieh, Hsueh-Liang Huang, Wen-Yuh Jywe, et al.
The Review of Scientific Instruments
|
June 7, 2011
Note: Development of a high resolution six-degrees-of-freedom optical vibrometer for precision stage
Tung Hsien Hsieh, Wen Yuh Jywe, Shang Liang Chen, et al.
The Review of Scientific Instruments
|
July 7, 2007
Development of a three-degree-of-freedom laser linear encoder for error measurement of a high precision stage
Hsueh-Liang Huang, Chien-Hung Liu, Wen-Yuh Jywe, et al.
Page
of 1