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HyeongU Kim

Showing results (1-10 of 2) with videos related to

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The Review of Scientific Instruments|March 3, 2016
Development of particle characteristics diagnosis system for nanoparticle analysis in vacuumDongbin Kim, Jihun Mun, HyeongU Kim, et al.
Nanotechnology|August 13, 2015
Controlled MoS₂ layer etching using CF₄ plasmaMin Hwan Jeon, Chisung Ahn, HyeongU Kim, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|March 3, 2016
Development of particle characteristics diagnosis system for nanoparticle analysis in vacuumDongbin Kim, Jihun Mun, HyeongU Kim, et al.
Nanotechnology|August 13, 2015
Controlled MoS₂ layer etching using CF₄ plasmaMin Hwan Jeon, Chisung Ahn, HyeongU Kim, et al.
Pageof 1