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Ian S Gilmore

Showing results (11-20 of 58) with videos related to

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The Analyst|July 14, 2011
Analysis of personal care products on model skin surfaces using DESI and PADI ambient mass spectrometryTara L Salter, Felicia M Green, Nilofar Faruqui, et al.
Rapid Communications in Mass Spectrometry : RCM|July 26, 2008
Imaging G-SIMS: a novel bismuth-manganese source emitterFelicia M Green, Felix Kollmer, Ewald Niehuis, et al.
The Journal of Physical Chemistry Letters|September 22, 2020
An Experimental and Theoretical Study of Laser Postionization of Femtosecond-Laser-Desorbed Drug MoleculesCornelius L Pieterse, Ivan Rungger, Ian S Gilmore, et al.
Journal of the American Society for Mass Spectrometry|September 29, 2011
Topography and field effects in secondary ion mass spectrometry--part I: conducting samplesJoanna L S Lee, Ian S Gilmore, Martin P Seah, et al.
Rapid Communications in Mass Spectrometry : RCM|November 6, 2012
Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogramSatoka Aoyagi, Ian S Gilmore, Ichiro Mihara, et al.
Angewandte Chemie (International Ed. in English)|July 1, 2020
Cryogenic OrbiSIMS Localizes Semi-Volatile Molecules in Biological TissuesClare L Newell, Jean-Luc Vorng, James I MacRae, et al.
The Journal of Physical Chemistry. B|February 8, 2008
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMSAlexander G Shard, Felicia M Green, Paul J Brewer, et al.
Analytical Chemistry|February 11, 2021
Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application <i>In Situ</i> Matrix-Enhanced Secondary Ion Mass SpectrometryMatthias Lorenz, Junting Zhang, Alexander G Shard, et al.
Journal of the American Society for Mass Spectrometry|June 5, 2014
Comparison of three plasma sources for ambient desorption/ionization mass spectrometryKirsty McKay, Tara L Salter, Andrew Bowfield, et al.
Nanoscale|November 6, 2015
Probing individual point defects in graphene via near-field Raman scatteringSandro Mignuzzi, Naresh Kumar, Barry Brennan, et al.
Pageof 6

Showing results (11-20 of 58) with videos related to

Sort By:
Pageof 6
The Analyst|July 14, 2011
Analysis of personal care products on model skin surfaces using DESI and PADI ambient mass spectrometryTara L Salter, Felicia M Green, Nilofar Faruqui, et al.
Rapid Communications in Mass Spectrometry : RCM|July 26, 2008
Imaging G-SIMS: a novel bismuth-manganese source emitterFelicia M Green, Felix Kollmer, Ewald Niehuis, et al.
The Journal of Physical Chemistry Letters|September 22, 2020
An Experimental and Theoretical Study of Laser Postionization of Femtosecond-Laser-Desorbed Drug MoleculesCornelius L Pieterse, Ivan Rungger, Ian S Gilmore, et al.
Journal of the American Society for Mass Spectrometry|September 29, 2011
Topography and field effects in secondary ion mass spectrometry--part I: conducting samplesJoanna L S Lee, Ian S Gilmore, Martin P Seah, et al.
Rapid Communications in Mass Spectrometry : RCM|November 6, 2012
Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogramSatoka Aoyagi, Ian S Gilmore, Ichiro Mihara, et al.
Angewandte Chemie (International Ed. in English)|July 1, 2020
Cryogenic OrbiSIMS Localizes Semi-Volatile Molecules in Biological TissuesClare L Newell, Jean-Luc Vorng, James I MacRae, et al.
The Journal of Physical Chemistry. B|February 8, 2008
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMSAlexander G Shard, Felicia M Green, Paul J Brewer, et al.
Analytical Chemistry|February 11, 2021
Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application <i>In Situ</i> Matrix-Enhanced Secondary Ion Mass SpectrometryMatthias Lorenz, Junting Zhang, Alexander G Shard, et al.
Journal of the American Society for Mass Spectrometry|June 5, 2014
Comparison of three plasma sources for ambient desorption/ionization mass spectrometryKirsty McKay, Tara L Salter, Andrew Bowfield, et al.
Nanoscale|November 6, 2015
Probing individual point defects in graphene via near-field Raman scatteringSandro Mignuzzi, Naresh Kumar, Barry Brennan, et al.
Pageof 6