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Micromachines|November 6, 2019
Design and Optimization of Germanium-Based Gate-Metal-Core Vertical Nanowire Tunnel FETWon Douk Jang, Young Jun Yoon, Min Su Cho, et al.Materials (Basel, Switzerland)|October 14, 2022
Improved Environment Stability of Y<sub>2</sub>O<sub>3</sub> RRAM Devices with Au Passivated Ag Top ElectrodesHae-In Kim, Taehun Lee, Won-Yong Lee, et al.Journal of Nanoscience and Nanotechnology|July 2, 2020
Design and Analysis of Metal-Oxide-Semiconductor Field-Effect Transistor-Based Capacitorless One-Transistor Embedded Dynamic Random-Access Memory with Double-Polysilicon Layer Using Grain Boundary for Hole StorageWon Douk Jang, Young Jun Yoon, Min Su Cho, et al.ACS Applied Materials & Interfaces|February 17, 2022
Environmentally and Electrically Stable Sol-Gel-Deposited SnO<sub>2</sub> Thin-Film Transistors with Controlled Passivation Layer Diffusion Penetration Depth That Minimizes Mobility DegradationWon-Yong Lee, Do Won Kim, Hyeon Joong Kim, et al.Materials (Basel, Switzerland)|March 10, 2022
Enhanced Switching Reliability of Sol-Gel-Processed Y<sub>2</sub>O<sub>3</sub> RRAM Devices Based on Y<sub>2</sub>O<sub>3</sub> Surface Roughness-Induced Local Electric FieldDo-Won Kim, Hyeon-Joong Kim, Won-Yong Lee, et al.Nanomaterials (Basel, Switzerland)|September 23, 2022
Importance of Structural Relaxation on the Electrical Characteristics and Bias Stability of Solution-Processed ZnSnO Thin-Film TransistorsYu-Jin Hwang, Do-Kyung Kim, Sang-Hwa Jeon, et al.Materials (Basel, Switzerland)|March 10, 2022
Flexible Sol-Gel-Processed Y<sub>2</sub>O<sub>3</sub> RRAM Devices Obtained via UV/Ozone-Assisted Photochemical Annealing ProcessHyeon-Joong Kim, Do-Won Kim, Won-Yong Lee, et al.Nanomaterials (Basel, Switzerland)|September 9, 2023
Sol-Gel-Processed Y<sub>2</sub>O<sub>3</sub> Multilevel Resistive Random-Access Memory Cells for Neural NetworksTaehun Lee, Hae-In Kim, Yoonjin Cho, et al.Nanomaterials (Basel, Switzerland)|August 12, 2023
Low-Temperature Enhancement-Mode Amorphous Oxide Thin-Film Transistors in Solution Process Using a Low-Pressure AnnealingWon Park, Jun-Hyeong Park, Jun-Su Eun, et al.Journal of Nanoscience and Nanotechnology|April 26, 2020
Effect of High-Speed Blade Coating on Electrical Characteristics in Polymer Based TransistorsJun-Ik Park, Hyun-Seok Jeong, Premkumar Vincent, et al.Pageof 6