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J Ciston

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.
Ultramicroscopy|January 4, 2011
Optimized conditions for imaging the effects of bonding charge density in electron microscopyJ Ciston, J S Kim, S J Haigh, et al.
Physical Review Letters|January 13, 2019
Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron ProbeH G Brown, Z Chen, M Weyland, et al.
Ultramicroscopy|December 28, 2010
Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanismsH Inada, D Su, R F Egerton, et al.
Ultramicroscopy|August 13, 2016
Practical aspects of diffractive imaging using an atomic-scale coherent electron probeZ Chen, M Weyland, P Ercius, et al.
Nature Communications|June 18, 2015
Surface determination through atomically resolved secondary-electron imagingJ Ciston, H G Brown, A J D'Alfonso, et al.
Nature Communications|June 9, 2018
Nature of the metal-insulator transition in few-unit-cell-thick LaNiO<sub>3</sub> filmsM Golalikhani, Q Lei, R U Chandrasena, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|September 15, 2007
A quantitative analysis of the cone-angle dependence in precession electron diffractionJ Ciston, B Deng, L D Marks, et al.
Ultramicroscopy|January 4, 2011
Optimized conditions for imaging the effects of bonding charge density in electron microscopyJ Ciston, J S Kim, S J Haigh, et al.
Physical Review Letters|January 13, 2019
Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron ProbeH G Brown, Z Chen, M Weyland, et al.
Ultramicroscopy|December 28, 2010
Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanismsH Inada, D Su, R F Egerton, et al.
Ultramicroscopy|August 13, 2016
Practical aspects of diffractive imaging using an atomic-scale coherent electron probeZ Chen, M Weyland, P Ercius, et al.
Nature Communications|June 18, 2015
Surface determination through atomically resolved secondary-electron imagingJ Ciston, H G Brown, A J D'Alfonso, et al.
Nature Communications|June 9, 2018
Nature of the metal-insulator transition in few-unit-cell-thick LaNiO<sub>3</sub> filmsM Golalikhani, Q Lei, R U Chandrasena, et al.
Pageof 1