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Journal of Microscopy|November 15, 2006
In situ electron beam induced current measurements of the local thickness in semiconductor devicesA Czerwinski, M Płuska, J Ratajczak, et al.Journal of Microscopy|May 27, 2010
Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistanceA Czerwinski, M Pluska, J Ratajczak, et al.Journal of Microscopy|November 15, 2006
Transmission electron microscopy characterization of the erbium silicide formation process using a Pt/Er stack on a silicon-on-insulator substrateA Łaszcz, J Katcki, J Ratajczak, et al.Journal of Microscopy|November 15, 2006
Elimination of scanning electron microscopy image periodic distortions with digital signal-processing methodsM Płuska, A Czerwinski, J Ratajczak, et al.Micron (Oxford, England : 1993)|April 9, 2008
Selective etching of dislocations in GaN and quantitative SEM analysis with shape-reconstruction methodM Wzorek, A Czerwinski, J Ratajczak, et al.Journal of Microscopy|May 27, 2010
Depth measurements of etch-pits in GaN with shape reconstruction from SEM imagesM Wzorek, A Czerwinski, J Ratajczak, et al.Journal of Microscopy|May 27, 2010
Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imagingM Pluska, A Czerwinski, J Ratajczak, et al.Journal of Microscopy|November 15, 2006
Buried amorphous-layer impact on dislocation densities in siliconM Wzorek, J Katcki, M Płuska, et al.Journal of Microscopy|November 12, 2009
New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradationM Płuska, A Czerwinski, J Ratajczak, et al.Journal of Microscopy|May 27, 2010
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasersA Łaszcz, A Czerwinski, J Ratajczak, et al.Pageof 2