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Optics Express
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March 27, 2021
Analysis of X-ray multilayer Laue lenses made by masked deposition
Henry N Chapman, Mauro Prasciolu, Kevin T Murray, et al.
The Review of Scientific Instruments
|
August 3, 2022
Precise wavefront characterization of x-ray optical elements using a laboratory source
J Lukas Dresselhaus, Holger Fleckenstein, Martin Domaracký, et al.
Optics Express
|
October 14, 2022
Robust ptychographic X-ray speckle tracking with multilayer Laue lenses
Nikolay Ivanov, J Lukas Dresselhaus, Jerome Carnis, et al.
Light, Science & Applications
|
May 29, 2023
Dose-efficient scanning Compton X-ray microscopy
Tang Li, J Lukas Dresselhaus, Nikolay Ivanov, et al.
Optics Express
|
June 11, 2024
X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses
J Lukas Dresselhaus, Margarita Zakharova, Nikolay Ivanov, et al.
Optics Express
|
November 22, 2024
Fast and efficient hard X-ray projection imaging below 10 nm resolution
Wenhui Zhang, J Lukas Dresselhaus, Holger Fleckenstein, et al.
Structural Dynamics (Melville, N.Y.)
|
January 16, 2025
Convergent-beam attosecond x-ray crystallography
Henry N Chapman, Chufeng Li, Saša Bajt, et al.
Optics Express
|
July 30, 2025
Focusing of X-ray free-electron laser pulses using multilayer Laue lenses
Margarita Zakharova, Jia Chyi Wong, J Lukas Dresselhaus, et al.
Physical Review Letters
|
May 12, 2023
Imaging via Correlation of X-Ray Fluorescence Photons
Fabian Trost, Kartik Ayyer, Mauro Prasciolu, et al.
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Search research articles
Search
Showing results (1-10 of 9) with videos related to
Sort By:
Page
of 1
Optics Express
|
March 27, 2021
Analysis of X-ray multilayer Laue lenses made by masked deposition
Henry N Chapman, Mauro Prasciolu, Kevin T Murray, et al.
The Review of Scientific Instruments
|
August 3, 2022
Precise wavefront characterization of x-ray optical elements using a laboratory source
J Lukas Dresselhaus, Holger Fleckenstein, Martin Domaracký, et al.
Optics Express
|
October 14, 2022
Robust ptychographic X-ray speckle tracking with multilayer Laue lenses
Nikolay Ivanov, J Lukas Dresselhaus, Jerome Carnis, et al.
Light, Science & Applications
|
May 29, 2023
Dose-efficient scanning Compton X-ray microscopy
Tang Li, J Lukas Dresselhaus, Nikolay Ivanov, et al.
Optics Express
|
June 11, 2024
X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses
J Lukas Dresselhaus, Margarita Zakharova, Nikolay Ivanov, et al.
Optics Express
|
November 22, 2024
Fast and efficient hard X-ray projection imaging below 10 nm resolution
Wenhui Zhang, J Lukas Dresselhaus, Holger Fleckenstein, et al.
Structural Dynamics (Melville, N.Y.)
|
January 16, 2025
Convergent-beam attosecond x-ray crystallography
Henry N Chapman, Chufeng Li, Saša Bajt, et al.
Optics Express
|
July 30, 2025
Focusing of X-ray free-electron laser pulses using multilayer Laue lenses
Margarita Zakharova, Jia Chyi Wong, J Lukas Dresselhaus, et al.
Physical Review Letters
|
May 12, 2023
Imaging via Correlation of X-Ray Fluorescence Photons
Fabian Trost, Kartik Ayyer, Mauro Prasciolu, et al.
Page
of 1