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Optics Express
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December 31, 2020
Laser wavelength metrology with low-finesse etalons and Bayer filters
J Nicholas Porter, Jarom S Jackson, Dallin S Durfee, et al.
The Review of Scientific Instruments
|
August 20, 2025
A compact tabletop extreme-ultraviolet source for polarization-sensitive ptychographic imaging
Taylor J Buckway, Aaron Redd, Hyrum Taylor, et al.
Journal of Applied Crystallography
|
February 6, 2026
Adaptively coupled phase retrieval in multi-peak Bragg coherent diffraction imaging
J Nicholas Porter, Yueheng Zhang, Ross J Harder, et al.
Journal of Synchrotron Radiation
|
May 31, 2023
Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging
Yueheng Zhang, J Nicholas Porter, Matthew J Wilkin, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 4) with videos related to
Sort By:
Page
of 1
Optics Express
|
December 31, 2020
Laser wavelength metrology with low-finesse etalons and Bayer filters
J Nicholas Porter, Jarom S Jackson, Dallin S Durfee, et al.
The Review of Scientific Instruments
|
August 20, 2025
A compact tabletop extreme-ultraviolet source for polarization-sensitive ptychographic imaging
Taylor J Buckway, Aaron Redd, Hyrum Taylor, et al.
Journal of Applied Crystallography
|
February 6, 2026
Adaptively coupled phase retrieval in multi-peak Bragg coherent diffraction imaging
J Nicholas Porter, Yueheng Zhang, Ross J Harder, et al.
Journal of Synchrotron Radiation
|
May 31, 2023
Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging
Yueheng Zhang, J Nicholas Porter, Matthew J Wilkin, et al.
Page
of 1