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Science (New York, N.Y.)|July 22, 2006
High-resolution three-dimensional imaging of dislocationsJ S Barnard, J Sharp, J R Tong, et al.
Micron (Oxford, England : 1993)|December 3, 2011
Low voltage STEM imaging of multi-walled carbon nanotubesY Beyer, R Beanland, P A Midgley
Ultramicroscopy|December 3, 2014
Enhanced quantification for 3D SEM-EDS: using the full set of available X-ray linesPierre Burdet, S A Croxall, P A Midgley
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