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Ultramicroscopy|June 21, 2016
Progress and new advances in simulating electron microscopy datasets using MULTEMI Lobato, S Van Aert, J VerbeeckUltramicroscopy|July 18, 2006
Model-based quantification of EELS spectra: Including the fine structureJ Verbeeck, S Van Aert, G BertoniUltramicroscopy|November 26, 2013
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyG T Martinez, A Rosenauer, A De Backer, et al.Ultramicroscopy|June 2, 2006
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic imagesM D Croitoru, D Van Dyck, S Van Aert, et al.Ultramicroscopy|June 21, 2014
Atomic resolution mapping of phonon excitations in STEM-EELS experimentsR Egoavil, N Gauquelin, G T Martinez, et al.Ultramicroscopy|September 14, 2020
Atom column detection from simultaneously acquired ABF and ADF STEM imagesJ Fatermans, A J den Dekker, K Müller-Caspary, et al.Ultramicroscopy|June 16, 2009
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyS Van Aert, J Verbeeck, R Erni, et al.Ultramicroscopy|August 31, 2015
Quantitative STEM normalisation: The importance of the electron fluxG T Martinez, L Jones, A De Backer, et al.Ultramicroscopy|November 28, 2016
Locating light and heavy atomic column positions with picometer precision using ISTEMK H W van den Bos, F F Krause, A Béché, et al.Pageof 7