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Journal of Research of the National Institute of Standards and Technology|March 19, 2016
Geometric Effects When Measuring Small Holes With Micro Contact ProbesJack Stone, Bala Muralikrishnan, Chittaranjan SahayMeasurement Science & Technology|July 30, 2021
Performance Evaluation of Terrestrial Laser Scanners - A ReviewBala MuralikrishnanOptics and Lasers in Engineering|February 22, 2021
Terrestrial laser scanner calibration and performance evaluation using the network methodShendong Shi, Bala Muralikrishnan, Daniel SawyerJournal of Forensic Sciences|January 7, 2026
Toward a documentary standard for performance testing of terrestrial laser scanners used in forensic practice: A statistical procedure to assess change in instrument precisionMary Gregg, Bala Muralikrishnan, Meghan ShillingJournal of Research of the National Institute of Standards and Technology|March 12, 2024
ASME B89.4.23 Performance Evaluation Tests and Geometry Errors in X-Ray Computed Tomography SystemsBala Muralikrishnan, Meghan Shilling, Vincent LeeMeasurement : Interdisciplinary Research and Perspectives|April 16, 2019
METROLOGICAL EVALUATION OF CONTRAST TARGET CENTER ALGORITHM FOR TERRESTRIAL LASER SCANNERSPrem Rachakonda, Bala Muralikrishnan, Daniel SawyerJournal of Research of the National Institute of Standards and Technology|September 23, 2024
Improvised Long Test Lengths via Stitching Scale Bar Method: Interim Testing of Laser TrackersVincent D Lee, Daniel Sawyer, Bala MuralikrishnanMeasurement Science & Technology|September 12, 2017
Determining geometric error model parameters of a terrestrial laser scanner through Two-face, Length-consistency, and Network methodsLing Wang, Bala Muralikrishnan, Prem Rachakonda, et al.Journal of Research of the National Institute of Standards and Technology|March 12, 2024
X-Ray Computed Tomography Instrument Performance Evaluation, Part III: Sensitivity to Detector Geometry and Rotation Stage Errors at Different MagnificationsPrashanth Jaganmohan, Bala Muralikrishnan, Meghan Shilling, et al.Journal of Research of the National Institute of Standards and Technology|February 23, 2016
A Model for Geometry-Dependent Errors in Length ArtifactsDaniel Sawyer, Brian Parry, Steven Phillips, et al.Pageof 11