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Beilstein Journal of Nanotechnology|December 15, 2018
In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopyJesús S Lacasa, Lisa Almonte, Jaime Colchero
Materials (Basel, Switzerland)|February 15, 2022
Kelvin Probe Microscopy Investigation of Poly-Octylthiophene AggregatesJoaquin Bermejo, Jaime Colchero, Elisa Palacios-Lidon
The Review of Scientific Instruments|May 3, 2013
Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopyJosé Abad, Juan Francisco González Martínez, Jaime Colchero
Nanotechnology|April 12, 2013
Calibration of oscillation amplitude in dynamic scanning force microscopyJuan Francisco González Martínez, Inés Nieto-Carvajal, Jaime Colchero
Physical Review Letters|December 31, 2005
Polarity effects on ZnO films grown along the nonpolar [1120] directionJesús Zúñiga-Pérez, Vicente Muñoz-Sanjosé, Elisa Palacios-Lidón, et al.
Nanoscale Research Letters|March 9, 2012
Nanoscale measurement of the power spectral density of surface roughness: how to solve a difficult experimental challengeJuan Francisco González Martínez, Inés Nieto-Carvajal, José Abad, et al.
Small (Weinheim an Der Bergstrasse, Germany)|January 31, 2007
Nanogoniometry with scanning force microscopy: a model study of CdTe thin filmsElisa Palacios-Lidón, Luis Guanter, Jesús Zúñiga-Pérez, et al.
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