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Jan Steinbrener

Showing results (1-10 of 21) with videos related to

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Sensors (Basel, Switzerland)|October 29, 2020
Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational InferenceJan Steinbrener, Konstantin Posch, Jürgen Pilz
European Radiology Experimental|July 19, 2023
Correction: Bridging the simulation-to-real gap for AI-based needle and target detection in robot-assisted ultrasound-guided interventionsVisar Arapi, Alexander Hardt-Stremayr, Stephan Weiss, et al.
European Radiology Experimental|June 18, 2023
Bridging the simulation-to-real gap for AI-based needle and target detection in robot-assisted ultrasound-guided interventionsVisar Arapi, Alexander Hardt-Stremayr, Stephan Weiss, et al.
Optics Express|December 18, 2010
Incorrect support and missing center tolerances of phasing algorithmsXiaojing Huang, Johanna Nelson, Jan Steinbrener, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|November 16, 2013
Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithmsStephan Kassemeyer, Aliakbar Jafarpour, Lukas Lomb, et al.
Heliyon|April 10, 2023
Learning metric volume estimation of fruits and vegetables from short monocular video sequencesJan Steinbrener, Vesna Dimitrievska, Federico Pittino, et al.
Optics Express|October 14, 2010
Data preparation and evaluation techniques for x-ray diffraction microscopyJan Steinbrener, Johanna Nelson, Xiaojing Huang, et al.
Optics Express|August 6, 2009
Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopyXiaojing Huang, Huijie Miao, Jan Steinbrener, et al.
Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment|May 7, 2011
Anti-contamination device for cryogenic soft X-ray diffraction microscopyXiaojing Huang, Huijie Miao, Johanna Nelson, et al.
Proceedings of the National Academy of Sciences of the United States of America|April 7, 2010
High-resolution x-ray diffraction microscopy of specifically labeled yeast cellsJohanna Nelson, Xiaojing Huang, Jan Steinbrener, et al.
Pageof 3

Showing results (1-10 of 21) with videos related to

Sort By:
Pageof 3
Sensors (Basel, Switzerland)|October 29, 2020
Measuring the Uncertainty of Predictions in Deep Neural Networks with Variational InferenceJan Steinbrener, Konstantin Posch, Jürgen Pilz
European Radiology Experimental|July 19, 2023
Correction: Bridging the simulation-to-real gap for AI-based needle and target detection in robot-assisted ultrasound-guided interventionsVisar Arapi, Alexander Hardt-Stremayr, Stephan Weiss, et al.
European Radiology Experimental|June 18, 2023
Bridging the simulation-to-real gap for AI-based needle and target detection in robot-assisted ultrasound-guided interventionsVisar Arapi, Alexander Hardt-Stremayr, Stephan Weiss, et al.
Optics Express|December 18, 2010
Incorrect support and missing center tolerances of phasing algorithmsXiaojing Huang, Johanna Nelson, Jan Steinbrener, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|November 16, 2013
Optimal mapping of x-ray laser diffraction patterns into three dimensions using routing algorithmsStephan Kassemeyer, Aliakbar Jafarpour, Lukas Lomb, et al.
Heliyon|April 10, 2023
Learning metric volume estimation of fruits and vegetables from short monocular video sequencesJan Steinbrener, Vesna Dimitrievska, Federico Pittino, et al.
Optics Express|October 14, 2010
Data preparation and evaluation techniques for x-ray diffraction microscopyJan Steinbrener, Johanna Nelson, Xiaojing Huang, et al.
Optics Express|August 6, 2009
Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopyXiaojing Huang, Huijie Miao, Jan Steinbrener, et al.
Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment|May 7, 2011
Anti-contamination device for cryogenic soft X-ray diffraction microscopyXiaojing Huang, Huijie Miao, Johanna Nelson, et al.
Proceedings of the National Academy of Sciences of the United States of America|April 7, 2010
High-resolution x-ray diffraction microscopy of specifically labeled yeast cellsJohanna Nelson, Xiaojing Huang, Jan Steinbrener, et al.
Pageof 3