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Jean-Michel Hartmann

Showing results (11-20 of 40) with videos related to

Pageof 4
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Optics Express|February 12, 2014
Low loss SiGe graded index waveguides for mid-IR applicationsMickael Brun, Pierre Labeye, Gilles Grand, et al.
Journal of Applied Crystallography|July 21, 2020
Impact and behavior of Sn during the Ni/GeSn solid-state reactionAndrea Quintero, Patrice Gergaud, Jean-Michel Hartmann, et al.
Optics Express|October 20, 2015
Design, fabrication and characterization of an AWG at 4.5 µmPierre Barritault, Mickael Brun, Pierre Labeye, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Nature Communications|December 20, 2019
Observing collisions beyond the secular approximation limitJunyang Ma, Haisu Zhang, Bruno Lavorel, et al.
Nature Communications|September 19, 2014
Germanium avalanche receiver for low power interconnectsLéopold Virot, Paul Crozat, Jean-Marc Fédéli, et al.
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
ACS Applied Materials & Interfaces|May 5, 2022
Microstructuring to Improve the Thermal Stability of GeSn LayersValentina Bonino, Nicolas Pauc, Vincent Calvo, et al.
Optics Express|January 16, 2019
GeSn heterostructure micro-disk laser operating at 230 KQuang Minh Thai, Nicolas Pauc, Joris Aubin, et al.
Pageof 4

Showing results (11-20 of 40) with videos related to

Sort By:
Pageof 4
Optics Express|February 12, 2014
Low loss SiGe graded index waveguides for mid-IR applicationsMickael Brun, Pierre Labeye, Gilles Grand, et al.
Journal of Applied Crystallography|July 21, 2020
Impact and behavior of Sn during the Ni/GeSn solid-state reactionAndrea Quintero, Patrice Gergaud, Jean-Michel Hartmann, et al.
Optics Express|October 20, 2015
Design, fabrication and characterization of an AWG at 4.5 µmPierre Barritault, Mickael Brun, Pierre Labeye, et al.
Ultramicroscopy|March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy|December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomographyRobert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Nature Communications|December 20, 2019
Observing collisions beyond the secular approximation limitJunyang Ma, Haisu Zhang, Bruno Lavorel, et al.
Nature Communications|September 19, 2014
Germanium avalanche receiver for low power interconnectsLéopold Virot, Paul Crozat, Jean-Marc Fédéli, et al.
Ultramicroscopy|October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparationTim Grieb, Moritz Tewes, Marco Schowalter, et al.
ACS Applied Materials & Interfaces|May 5, 2022
Microstructuring to Improve the Thermal Stability of GeSn LayersValentina Bonino, Nicolas Pauc, Vincent Calvo, et al.
Optics Express|January 16, 2019
GeSn heterostructure micro-disk laser operating at 230 KQuang Minh Thai, Nicolas Pauc, Joris Aubin, et al.
Pageof 4