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Optics Express
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February 12, 2014
Low loss SiGe graded index waveguides for mid-IR applications
Mickael Brun, Pierre Labeye, Gilles Grand, et al.
Journal of Applied Crystallography
|
July 21, 2020
Impact and behavior of Sn during the Ni/GeSn solid-state reaction
Andrea Quintero, Patrice Gergaud, Jean-Michel Hartmann, et al.
Optics Express
|
October 20, 2015
Design, fabrication and characterization of an AWG at 4.5 µm
Pierre Barritault, Mickael Brun, Pierre Labeye, et al.
Ultramicroscopy
|
March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomography
Robert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy
|
December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomography
Robert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Nature Communications
|
December 20, 2019
Observing collisions beyond the secular approximation limit
Junyang Ma, Haisu Zhang, Bruno Lavorel, et al.
Nature Communications
|
September 19, 2014
Germanium avalanche receiver for low power interconnects
Léopold Virot, Paul Crozat, Jean-Marc Fédéli, et al.
Ultramicroscopy
|
October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation
Tim Grieb, Moritz Tewes, Marco Schowalter, et al.
ACS Applied Materials & Interfaces
|
May 5, 2022
Microstructuring to Improve the Thermal Stability of GeSn Layers
Valentina Bonino, Nicolas Pauc, Vincent Calvo, et al.
Optics Express
|
January 16, 2019
GeSn heterostructure micro-disk laser operating at 230 K
Quang Minh Thai, Nicolas Pauc, Joris Aubin, et al.
Page
of 4
Search research articles
Search
Showing results (11-20 of 40) with videos related to
Sort By:
Page
of 4
Optics Express
|
February 12, 2014
Low loss SiGe graded index waveguides for mid-IR applications
Mickael Brun, Pierre Labeye, Gilles Grand, et al.
Journal of Applied Crystallography
|
July 21, 2020
Impact and behavior of Sn during the Ni/GeSn solid-state reaction
Andrea Quintero, Patrice Gergaud, Jean-Michel Hartmann, et al.
Optics Express
|
October 20, 2015
Design, fabrication and characterization of an AWG at 4.5 µm
Pierre Barritault, Mickael Brun, Pierre Labeye, et al.
Ultramicroscopy
|
March 28, 2015
Quantitative analysis of Si/SiGeC superlattices using atom probe tomography
Robert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Ultramicroscopy
|
December 16, 2014
Quantitative investigation of SiGeC layers using atom probe tomography
Robert Estivill, Adeline Grenier, Sébastien Duguay, et al.
Nature Communications
|
December 20, 2019
Observing collisions beyond the secular approximation limit
Junyang Ma, Haisu Zhang, Bruno Lavorel, et al.
Nature Communications
|
September 19, 2014
Germanium avalanche receiver for low power interconnects
Léopold Virot, Paul Crozat, Jean-Marc Fédéli, et al.
Ultramicroscopy
|
October 28, 2017
Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation
Tim Grieb, Moritz Tewes, Marco Schowalter, et al.
ACS Applied Materials & Interfaces
|
May 5, 2022
Microstructuring to Improve the Thermal Stability of GeSn Layers
Valentina Bonino, Nicolas Pauc, Vincent Calvo, et al.
Optics Express
|
January 16, 2019
GeSn heterostructure micro-disk laser operating at 230 K
Quang Minh Thai, Nicolas Pauc, Joris Aubin, et al.
Page
of 4