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The Review of Scientific Instruments|January 1, 2008
Portable x-ray fluorescence spectrometer for coating thickness measurementAlain Carapelle, Karl Fleury-Frenette, Jean-Paul Collette, et al.
Sensors (Basel, Switzerland)|September 15, 2017
Quantitative Accelerated Life Testing of MEMS AccelerometersMarius Bâzu, Lucian Gălăţeanu, Virgil Emil Ilian, et al.
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