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Jeremy Coupland

Showing results (11-20 of 16) with videos related to

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Optics Express|March 1, 2017
On tilt and curvature dependent errors and the calibration of coherence scanning interferometryRong Su, Yuhang Wang, Jeremy Coupland, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 10, 2021
Scattering and three-dimensional imaging in surface topography measuring interference microscopyRong Su, Jeremy Coupland, Colin Sheppard, et al.
Optics Express|November 23, 2021
Surface measuring coherence scanning interferometry beyond the specular reflection limitMatthew Thomas, Rong Su, Peter de Groot, et al.
Applied Optics|October 22, 2011
Determination of overlap in lidar systemsJoshua Vande Hey, Jeremy Coupland, Ming Hui Foo, et al.
Applied Optics|June 10, 2026
Characterization of topographic lateral resolution in coherence scanning interferometry based on a virtual instrumentRunzhou Hou, Xiaoyue Qiao, Sotero Ordones, et al.
Applied Optics|November 13, 2015
Model-based defect detection on structured surfaces having optically unresolved featuresDaniel O'Connor, Andrew J Henning, Ben Sherlock, et al.
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Showing results (11-20 of 16) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 16 results.
Optics Express|March 1, 2017
On tilt and curvature dependent errors and the calibration of coherence scanning interferometryRong Su, Yuhang Wang, Jeremy Coupland, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 10, 2021
Scattering and three-dimensional imaging in surface topography measuring interference microscopyRong Su, Jeremy Coupland, Colin Sheppard, et al.
Optics Express|November 23, 2021
Surface measuring coherence scanning interferometry beyond the specular reflection limitMatthew Thomas, Rong Su, Peter de Groot, et al.
Applied Optics|October 22, 2011
Determination of overlap in lidar systemsJoshua Vande Hey, Jeremy Coupland, Ming Hui Foo, et al.
Applied Optics|June 10, 2026
Characterization of topographic lateral resolution in coherence scanning interferometry based on a virtual instrumentRunzhou Hou, Xiaoyue Qiao, Sotero Ordones, et al.
Applied Optics|November 13, 2015
Model-based defect detection on structured surfaces having optically unresolved featuresDaniel O'Connor, Andrew J Henning, Ben Sherlock, et al.
Pageof 2