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The Review of Scientific Instruments|February 4, 2012
High-speed force load in force measurement in liquid using scanning probe microscopeYan Zhang, Qingze Zou
The Review of Scientific Instruments|August 3, 2014
High-speed adaptive contact-mode atomic force microscopy imaging with near-minimum-forceJuan Ren, Qingze Zou
Beilstein Journal of Nanotechnology|September 9, 2017
High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approachJuan Ren, Qingze Zou
Ultramicroscopy|September 16, 2018
Active control of acoustics-caused nano-vibration in atomic force microscope imagingSicheng Yi, Tianwei Li, Qingze Zou
Journal of Nanoscience and Nanotechnology|June 25, 2008
Nano-holes in silicon wafers using laser-induced surface plasmon polaritonsPal Molian, Zhiqun Lin, Qingze Zou
Nanotechnology|May 8, 2009
A control approach to high-speed probe-based nanofabricationYan Yan, Qingze Zou, Zhiqun Lin
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