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Ultramicroscopy|December 16, 2014
Thermal magnetic field noise: electron optics and decoherenceStephan Uhlemann, Heiko Müller, Joachim Zach, et al.Physical Review Letters|August 13, 2013
Thermal magnetic field noise limits resolution in transmission electron microscopyStephan Uhlemann, Heiko Müller, Peter Hartel, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 16, 2010
New electrostatic phase plate for phase-contrast transmission electron microscopy and its application for wave-function reconstructionKatrin Schultheiss, Joachim Zach, Bjoern Gamm, et al.Journal of Electron Microscopy|April 29, 2009
First application of Cc-corrected imaging for high-resolution and energy-filtered TEMBernd Kabius, Peter Hartel, Maximilian Haider, et al.Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.Pageof 1