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John A Kramar

Showing results (1-10 of 7) with videos related to

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Journal of Nanoparticle Research : an Interdisciplinary Forum for Nanoscale Science and Technology|October 9, 2024
Dynamic Light Scattering Distributions by Any MeansNatalia Farkas, John A Kramar
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|March 12, 2025
Tip-induced deformation of polystyrene latex reference nanoparticles in atomic force microscopyNatalia Farkas, John A Kramar
Optics Express|July 28, 2016
Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopyRavi Kiran Attota, Peter Weck, John A Kramar, et al.
Journal of Research of the National Institute of Standards and Technology|March 19, 2016
Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable MethodRichard S Gates, Mark G Reitsma, John A Kramar, et al.
The Review of Scientific Instruments|December 3, 2008
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic forceKoo-Hyun Chung, Stefan Scholz, Gordon A Shaw, et al.
Metrologia|March 3, 2020
Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instrumentsKayori Takahashi, John A Kramar, Natalia Farkas, et al.
Analytical Chemistry|May 16, 2025
Derivation of Particle Number Concentration from the Size Distribution: Theory and ApplicationsNatalia Farkas, John A Kramar, Antonio R Montoro Bustos, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Journal of Nanoparticle Research : an Interdisciplinary Forum for Nanoscale Science and Technology|October 9, 2024
Dynamic Light Scattering Distributions by Any MeansNatalia Farkas, John A Kramar
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|March 12, 2025
Tip-induced deformation of polystyrene latex reference nanoparticles in atomic force microscopyNatalia Farkas, John A Kramar
Optics Express|July 28, 2016
Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopyRavi Kiran Attota, Peter Weck, John A Kramar, et al.
Journal of Research of the National Institute of Standards and Technology|March 19, 2016
Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable MethodRichard S Gates, Mark G Reitsma, John A Kramar, et al.
The Review of Scientific Instruments|December 3, 2008
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic forceKoo-Hyun Chung, Stefan Scholz, Gordon A Shaw, et al.
Metrologia|March 3, 2020
Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instrumentsKayori Takahashi, John A Kramar, Natalia Farkas, et al.
Analytical Chemistry|May 16, 2025
Derivation of Particle Number Concentration from the Size Distribution: Theory and ApplicationsNatalia Farkas, John A Kramar, Antonio R Montoro Bustos, et al.
Pageof 1