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Journal of Nanoparticle Research : an Interdisciplinary Forum for Nanoscale Science and Technology
|
October 9, 2024
Dynamic Light Scattering Distributions by Any Means
Natalia Farkas, John A Kramar
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society
|
March 12, 2025
Tip-induced deformation of polystyrene latex reference nanoparticles in atomic force microscopy
Natalia Farkas, John A Kramar
Optics Express
|
July 28, 2016
Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopy
Ravi Kiran Attota, Peter Weck, John A Kramar, et al.
Journal of Research of the National Institute of Standards and Technology
|
March 19, 2016
Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method
Richard S Gates, Mark G Reitsma, John A Kramar, et al.
The Review of Scientific Instruments
|
December 3, 2008
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Koo-Hyun Chung, Stefan Scholz, Gordon A Shaw, et al.
Metrologia
|
March 3, 2020
Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instruments
Kayori Takahashi, John A Kramar, Natalia Farkas, et al.
Analytical Chemistry
|
May 16, 2025
Derivation of Particle Number Concentration from the Size Distribution: Theory and Applications
Natalia Farkas, John A Kramar, Antonio R Montoro Bustos, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 7) with videos related to
Sort By:
Page
of 1
Journal of Nanoparticle Research : an Interdisciplinary Forum for Nanoscale Science and Technology
|
October 9, 2024
Dynamic Light Scattering Distributions by Any Means
Natalia Farkas, John A Kramar
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society
|
March 12, 2025
Tip-induced deformation of polystyrene latex reference nanoparticles in atomic force microscopy
Natalia Farkas, John A Kramar
Optics Express
|
July 28, 2016
Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopy
Ravi Kiran Attota, Peter Weck, John A Kramar, et al.
Journal of Research of the National Institute of Standards and Technology
|
March 19, 2016
Atomic Force Microscope Cantilever Flexural Stiffness Calibration: Toward a Standard Traceable Method
Richard S Gates, Mark G Reitsma, John A Kramar, et al.
The Review of Scientific Instruments
|
December 3, 2008
SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Koo-Hyun Chung, Stefan Scholz, Gordon A Shaw, et al.
Metrologia
|
March 3, 2020
Interlaboratory comparison of nanoparticle size measurements between NMIJ and NIST using two different types of dynamic light scattering instruments
Kayori Takahashi, John A Kramar, Natalia Farkas, et al.
Analytical Chemistry
|
May 16, 2025
Derivation of Particle Number Concentration from the Size Distribution: Theory and Applications
Natalia Farkas, John A Kramar, Antonio R Montoro Bustos, et al.
Page
of 1