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John F Seely

Showing results (11-20 of 29) with videos related to

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The Review of Scientific Instruments|November 3, 2017
X-ray spectrometer having 12 000 resolving power at 8 keV energyJohn F Seely, Lawrence T Hudson, Albert Henins, et al.
Applied Optics|May 22, 2008
Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometersJohn F Seely, Lawrence T Hudson, Glenn E Holland, et al.
Applied Optics|June 3, 2009
Measurement of dysprosium optical constants in the 2-830 eV spectral range using a transmittance method, and compilation of the revised optical constants of lanthanum, terbium, neodymium, and gadoliniumBenjawan Kjornrattanawanich, David L Windt, Jeffrey A Bellotti, et al.
Optics Letters|December 14, 2005
Terbium-based extreme ultraviolet multilayersDavid L Windt, John F Seely, Benjawan Kjornrattanawanich, et al.
Applied Optics|October 14, 2009
Performance optimization of Si/Gd extreme ultraviolet multilayersDavid L Windt, Jeffrey A Bellotti, Benjawan Kjornrattanawanich, et al.
Applied Optics|April 1, 2006
SiC/Tb and Si/Tb multilayer coatings for extreme ultraviolet solar imagingBenjawan Kjornrattanawanich, David L Windt, John F Seely, et al.
Applied Optics|January 6, 2009
X-ray modulation transfer functions of photostimulable phosphor image plates and scannersJohn F Seely, Glenn E Holland, Lawrence T Hudson, et al.
Applied Optics|September 5, 2002
X-ray absolute calibration of the time response of a silicon photodiodeJohn F Seely, Craig N Boyer, Glenn E Holland, et al.
Applied Optics|November 3, 2009
Radiometry and metrology of a phase zone plate measured by extreme ultraviolet synchrotron radiationJohn F Seely, Benjawan Kjornrattanawanich, James C Bremer, et al.
Applied Optics|September 11, 2019
High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6  keV to 22  keV energy rangeJohn F Seely, Eric Galtier, Lawrence T Hudson, et al.
Pageof 3

Showing results (11-20 of 29) with videos related to

Sort By:
Pageof 3
The Review of Scientific Instruments|November 3, 2017
X-ray spectrometer having 12 000 resolving power at 8 keV energyJohn F Seely, Lawrence T Hudson, Albert Henins, et al.
Applied Optics|May 22, 2008
Enhanced x-ray resolving power achieved behind the focal circles of Cauchois spectrometersJohn F Seely, Lawrence T Hudson, Glenn E Holland, et al.
Applied Optics|June 3, 2009
Measurement of dysprosium optical constants in the 2-830 eV spectral range using a transmittance method, and compilation of the revised optical constants of lanthanum, terbium, neodymium, and gadoliniumBenjawan Kjornrattanawanich, David L Windt, Jeffrey A Bellotti, et al.
Optics Letters|December 14, 2005
Terbium-based extreme ultraviolet multilayersDavid L Windt, John F Seely, Benjawan Kjornrattanawanich, et al.
Applied Optics|October 14, 2009
Performance optimization of Si/Gd extreme ultraviolet multilayersDavid L Windt, Jeffrey A Bellotti, Benjawan Kjornrattanawanich, et al.
Applied Optics|April 1, 2006
SiC/Tb and Si/Tb multilayer coatings for extreme ultraviolet solar imagingBenjawan Kjornrattanawanich, David L Windt, John F Seely, et al.
Applied Optics|January 6, 2009
X-ray modulation transfer functions of photostimulable phosphor image plates and scannersJohn F Seely, Glenn E Holland, Lawrence T Hudson, et al.
Applied Optics|September 5, 2002
X-ray absolute calibration of the time response of a silicon photodiodeJohn F Seely, Craig N Boyer, Glenn E Holland, et al.
Applied Optics|November 3, 2009
Radiometry and metrology of a phase zone plate measured by extreme ultraviolet synchrotron radiationJohn F Seely, Benjawan Kjornrattanawanich, James C Bremer, et al.
Applied Optics|September 11, 2019
High x-ray resolving power utilizing asymmetric diffraction from a quartz transmission crystal measured in the 6  keV to 22  keV energy rangeJohn F Seely, Eric Galtier, Lawrence T Hudson, et al.
Pageof 3