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John Fournelle

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 4, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis ProgramAurélien Moy, John Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 8, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified <i>ϕ</i>(<i>ρz</i>) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung FluorescenceAurélien Moy, John Fournelle
Applied Spectroscopy|November 12, 2015
Non-Sequential Spectral Acquisitions and Data Reconstruction to Remove Time-Dependent Effects from X-Ray SpectraPhillip Gopon, Peter Sobol, John Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 13, 2019
Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old ApproachAurélien Moy, John Fournelle, Anette von der Handt
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 30, 2013
Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-raysPhillip Gopon, John Fournelle, Peter E Sobol, et al.
Environmental Science & Technology|May 30, 2013
Vanadate and acetate biostimulation of contaminated sediments decreases diversity, selects for specific taxa, and decreases aqueous V5+ concentrationAlexis P Yelton, Kenneth H Williams, John Fournelle, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for MicroanalysisJohn J Donovan, Aurélien Moy, Anette von der Handt, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 4, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis ProgramAurélien Moy, John Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 8, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified <i>ϕ</i>(<i>ρz</i>) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung FluorescenceAurélien Moy, John Fournelle
Applied Spectroscopy|November 12, 2015
Non-Sequential Spectral Acquisitions and Data Reconstruction to Remove Time-Dependent Effects from X-Ray SpectraPhillip Gopon, Peter Sobol, John Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 13, 2019
Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old ApproachAurélien Moy, John Fournelle, Anette von der Handt
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 30, 2013
Low-voltage electron-probe microanalysis of Fe-Si compounds using soft X-raysPhillip Gopon, John Fournelle, Peter E Sobol, et al.
Environmental Science & Technology|May 30, 2013
Vanadate and acetate biostimulation of contaminated sediments decreases diversity, selects for specific taxa, and decreases aqueous V5+ concentrationAlexis P Yelton, Kenneth H Williams, John Fournelle, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for MicroanalysisJohn J Donovan, Aurélien Moy, Anette von der Handt, et al.
Pageof 1