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Jon Geist

Showing results (11-20 of 28) with videos related to

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Journal of Research of the National Institute of Standards and Technology|May 3, 2016
MEMS Young's Modulus and Step Height Measurements With Round Robin ResultsJanet Marshall, Richard A Allen, Craig D McGray, et al.
Journal of Research of the National Institute of Standards and Technology|June 9, 2016
Simple Thermal-Efficiency Model for CMOS-Microhotplate DesignJon Geist, M Yaqub Afridi, Ankush Varma, et al.
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Gravity-Based Characterization of Three-Axis Accelerometers in Terms of Intrinsic Accelerometer ParametersJon Geist, Muhammad Yaqub Afridi, Craig D McGray, et al.
Journal of Research of the National Institute of Standards and Technology|April 26, 2016
Microwave Power Absorption in Low-Reflectance, Complex, Lossy Transmission LinesJon Geist, Jayna J Shah, Mulpuri V Rao, et al.
Journal of Microelectromechanical Systems : a Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems|May 17, 2019
Particle Tracking of Microelectromechanical System Performance and ReliabilityCraig R Copeland, Craig D McGray, Jon Geist, et al.
Journal of Research of the National Institute of Standards and Technology|February 11, 2017
Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part I. Simulation ProgramsJon Geist, Deane Chandler-Horowitz, A M Robinson, et al.
Journal of Research of the National Institute of Standards and Technology|February 11, 2017
Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part II. Interpreting Oxide-Bias ExperimentsJon Geist, Rainer Köhler, Roland Goebel, et al.
Lab on a Chip|January 27, 2012
DNA molecules descending a nanofluidic staircase by entropophoresisSamuel M Stavis, Jon Geist, Michael Gaitan, et al.
Journal of Research of the National Institute of Standards and Technology|February 10, 2017
An Accurate Value for the Absorption Coefficient of Silicon at 633 nmJon Geist, A Russell Schaefer, Jun-Feng Song, et al.
Nature Communications|June 25, 2021
Accurate localization microscopy by intrinsic aberration calibrationCraig R Copeland, Craig D McGray, B Robert Ilic, et al.
Pageof 3

Showing results (11-20 of 28) with videos related to

Sort By:
Pageof 3
Journal of Research of the National Institute of Standards and Technology|May 3, 2016
MEMS Young's Modulus and Step Height Measurements With Round Robin ResultsJanet Marshall, Richard A Allen, Craig D McGray, et al.
Journal of Research of the National Institute of Standards and Technology|June 9, 2016
Simple Thermal-Efficiency Model for CMOS-Microhotplate DesignJon Geist, M Yaqub Afridi, Ankush Varma, et al.
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
Gravity-Based Characterization of Three-Axis Accelerometers in Terms of Intrinsic Accelerometer ParametersJon Geist, Muhammad Yaqub Afridi, Craig D McGray, et al.
Journal of Research of the National Institute of Standards and Technology|April 26, 2016
Microwave Power Absorption in Low-Reflectance, Complex, Lossy Transmission LinesJon Geist, Jayna J Shah, Mulpuri V Rao, et al.
Journal of Microelectromechanical Systems : a Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems|May 17, 2019
Particle Tracking of Microelectromechanical System Performance and ReliabilityCraig R Copeland, Craig D McGray, Jon Geist, et al.
Journal of Research of the National Institute of Standards and Technology|February 11, 2017
Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part I. Simulation ProgramsJon Geist, Deane Chandler-Horowitz, A M Robinson, et al.
Journal of Research of the National Institute of Standards and Technology|February 11, 2017
Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications Part II. Interpreting Oxide-Bias ExperimentsJon Geist, Rainer Köhler, Roland Goebel, et al.
Lab on a Chip|January 27, 2012
DNA molecules descending a nanofluidic staircase by entropophoresisSamuel M Stavis, Jon Geist, Michael Gaitan, et al.
Journal of Research of the National Institute of Standards and Technology|February 10, 2017
An Accurate Value for the Absorption Coefficient of Silicon at 633 nmJon Geist, A Russell Schaefer, Jun-Feng Song, et al.
Nature Communications|June 25, 2021
Accurate localization microscopy by intrinsic aberration calibrationCraig R Copeland, Craig D McGray, B Robert Ilic, et al.
Pageof 3